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MOS devices
Dosimetry
10
Dosimeters
8
Nanoelectronics
8
Radiation effects
8
High-k gate dielectrics
6
Ionizing radiation
6
Irradiation
6
Metal oxide semiconductor
6
Metallic compounds
6
Radiation shielding
6
High-K gate dielectrics
5
Capacitance
4
Comparative analysis
4
Hafnium oxides
4
High-k dielectric
4
Mos dosimeter
4
Radioactivity
4
radiation effects
4
8-bit microcontrollers
2
Absorbed dose
2
Alumina
2
Analytic expressions
2
Basic operation
2
Built-in potential
2
C-V curve
2
Capacitance voltage
2
Capacitance-voltage curve
2
Capacitive structure
2
Charge trapping/detrapping
2
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1por Sambuco Salomone, Lucas, Carbonetto, Sebastián, García Inza, Mariano, Lipovetzky, José, Redín, Eduardo Gabriel, Campabadal, Francesca, Faigón, Adrián
Publicado 2011Aportado por: SEDICI (UNLP)Objeto de conferencia -
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