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Aluminum
1
Atomic layer deposited
1
Atomic layer deposition
1
C-V measurement
1
Capacitance-voltage techniques
1
Constant capacitance
Electrical characteristic
1
Electron trap density
1
Electron traps
1
Experimental evidence
1
Insulating layers
1
MOS capacitors
1
Main effect
1
Non-volatile memories
1
Non-volatile memory application
1
Physical model
1
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1