Materias dentro de su búsqueda.
Materias dentro de su búsqueda.
Insulating layers
2
MOS devices
2
Aluminum
1
Atomic layer deposited
1
Atomic layer deposition
1
C-V measurement
1
Capacitance
1
Capacitance-voltage curve
1
Capacitance-voltage techniques
1
Charge trapping/detrapping
1
Constant capacitance
1
Dose measurements
1
Dose range
1
Dosimeters
1
Dosimetry
1
Electrical characteristic
1
Electron trap density
1
Electron traps
1
Experimental evidence
1
Gamma rays
1
Gate dielectrics
1
Hafnium oxides
1
High-K gate dielectrics
1
High-k gate dielectrics
1
Hysteresis
1
Induced charges
1
Initial saturation
1
Interface trapping
1
MOS capacitors
1
Main effect
1
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1por Salomone, L.S., Carbonetto, S.H., Inza, M.A.G., Lipovetzky, J., Redín, E.G., Campabadal, F., Faigón, A.Materias: “...Charge trapping/detrapping...”
CONF -
2Materias: “...Interface trapping...”
JOUR -
3por Sambuco Salomone, L., Lipovetzky, J., Carbonetto, S.H., García Inza, M.A., Redin, E.G., Campabadal, F., Faigón, A.Materias: “...Electron trap density...”
JOUR