Materias dentro de su búsqueda.
Materias dentro de su búsqueda.
MOS capacitors
2
Aluminum
1
Atomic layer deposited
1
Atomic layer deposition
1
C-V measurement
1
Capacitance-voltage techniques
1
Constant capacitance
1
Electrical characteristic
1
Electron trap density
1
Electron traps
1
Experimental evidence
1
Hafnium compounds
1
High-K dielectrics
1
High-k dielectric
1
Insulating layers
1
MOS
1
Main effect
1
Measurement techniques
1
Nanoelectronics
1
Non-volatile memories
1
Non-volatile memory application
1
Physical model
1
Radiation effects
1
Radiation response
1
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1por Salomone, L.S., Kasulin, A., Inza, M.G., Lipovetzky, J., Redin, E., Carbonetto, S., Campabadal, F., Faigón, A.Materias: “...MOS capacitors...”
CONF -
2por Sambuco Salomone, L., Lipovetzky, J., Carbonetto, S.H., García Inza, M.A., Redin, E.G., Campabadal, F., Faigón, A.Materias: “...MOS capacitors...”
JOUR