Materias dentro de su búsqueda.
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Aluminum
1
Atomic layer deposited
1
Atomic layer deposition
1
C-V measurement
1
Capacitance-voltage techniques
1
Constant capacitance
1
Electrical characteristic
1
Electron trap density
Electron traps
1
Experimental evidence
1
Insulating layers
1
MOS capacitors
1
Main effect
1
Non-volatile memories
1
Non-volatile memory application
1
Physical model
1
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1por Sambuco Salomone, L., Lipovetzky, J., Carbonetto, S.H., García Inza, M.A., Redin, E.G., Campabadal, F., Faigón, A.Materias: “...MOS capacitors...”
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