Materias dentro de su búsqueda.
Materias dentro de su búsqueda.
Absorbed dose
1
Analytic expressions
1
Dosimetry
1
Error compensation
1
Experimental data
1
Interface traps
1
Ionizing radiation
1
Irradiation
1
MOS devices
1
Metal oxide semiconductor
1
Metallic compounds
1
Radiation effects
1
Radiation shielding
1
Semiconductor devices
1
Temperature
1
Temperature fluctuation
1
Thick gate oxides
1
Zero temperature coefficients
1
ionizing radiation sensors
1
radiation effects
1
temperature
1
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1por Carbonetto, S.H., García Inza, M.A., Lipovetzky, J., Redin, E.G., Sambuco Salomone, L., Faigon, A.Materias: “...Error compensation...”
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