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Nanoelectronics
2
Capacitance
1
Capacitance-voltage curve
1
Charge trapping/detrapping
1
Dosimeters
1
Dosimetry
1
Gate dielectrics
1
Gate oxide
1
Hafnium oxides
1
Heat radiation
1
High dose rate
1
High-K gate dielectrics
1
High-k gate dielectrics
1
Hysteresis
1
Insulating layers
1
Ionizing radiation
1
Low dose radiation
1
MOS devices
1
MOSFET devices
1
MOSFETs
1
Monitoring
1
Mos dosimeter
1
Normal operating conditions
1
Nuclear reactors
1
Order of magnitude
1
P-channel MOS
1
Physical parameters
1
Radiation monitoring
1
Reference currents
1
Temperature
1
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1
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2