Characterization of titanium films deposited with a cathodic arc using a straight magnetic duct

Nanostructured Ti films were obtained employing a cathodic arc with a straight magnetic filter. The films were characterized using X-ray diffraction, scanning electron and atomic force microscopy. The films were found to be dense and with columnar grains, whose size increased with the exposure time....

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Detalles Bibliográficos
Autores principales:	Bermeo, F., Torre, H.D., Kleiman, A., Minotti, F., Marquez, A.
Formato:	CONF
Materias:	Atomic force microscopy Deposition Deposition rates Magnetism Titanium X ray diffraction Axial positions Columnar grain Film roughness Macro-particles Nanostructured Ti Radial position Scanning electrons Titanium film Ducts
Acceso en línea:	http://hdl.handle.net/20.500.12110/paper_17426588_v511_n1_p_Bermeo
Aporte de:	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

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