Design of a phase shifting interferometer in the EUV for high precision metrology

We present the design of phase shift interferometer for the extreme ultraviolet (EUV) that will be used with the illumination provided by a table top Ne-like Ar laser emitting at 46.9 nm. We develop a model that computes the beam propagation trough the instrument, taking into account the influence o...

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Detalles Bibliográficos
Autores principales: Capeluto, María Gabriela, Marconi, Mario Carlos, Iemmi, Claudio César
Publicado: 2011
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Acceso en línea:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_17426588_v274_n1_p_Capeluto
http://hdl.handle.net/20.500.12110/paper_17426588_v274_n1_p_Capeluto
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