Design of a phase shifting interferometer in the EUV for high precision metrology
We present the design of phase shift interferometer for the extreme ultraviolet (EUV) that will be used with the illumination provided by a table top Ne-like Ar laser emitting at 46.9 nm. We develop a model that computes the beam propagation trough the instrument, taking into account the influence o...
Guardado en:
Autores principales: | Capeluto, María Gabriela, Marconi, Mario Carlos, Iemmi, Claudio César |
---|---|
Publicado: |
2011
|
Materias: | |
Acceso en línea: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_17426588_v274_n1_p_Capeluto http://hdl.handle.net/20.500.12110/paper_17426588_v274_n1_p_Capeluto |
Aporte de: |
Ejemplares similares
-
Design of a phase shifting interferometer in the EUV for high precision metrology
por: Capeluto, M.G., et al.
Publicado: (2011) -
Design of a phase shifting interferometer in the EUV for high precision metrology
por: Capeluto, M.G., et al. -
Design of a phase shifting interferometer in the EUV for high precision metrology
por: Capeluto, M.G., et al.
Publicado: (2011) -
Design of a phase-shifting interferometer in the extreme ultraviolet for high-precision metrology
por: Capeluto, María Gabriela, et al.
Publicado: (2014) -
Design of a phase-shifting interferometer in the extreme ultraviolet for high-precision metrology
por: Capeluto, M.G., et al.