In situ electrical characterization of palladium-based single electron transistors made by electromigration technique

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Detalles Bibliográficos
Autores principales: Arzubiaga, L., Golmar, F., Llopis, R., Casanova, F., Hueso, L. E.
Formato: article
Lenguaje:Inglés
Publicado: AIP Publishing 2014
Materias:
Electricidad
Electrones
Transistores
Paladio
Electrodos
Aleaciones de níquel
Electrostática
Acceso en línea:http://www-biblio.inti.gob.ar:80/gsdl/collect/inti/index/assoc/HASH01cf/75392c65.dir/doc.pdf
Aporte de:
Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) de Instituto Nacional de Tecnología Industrial (INTI)
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spelling I60-R166-HASH01cf75392c6564912006e2352021-07-14 Arzubiaga, L. Golmar, F. Llopis, R. Casanova, F. Hueso, L. E. openAccess Electricidad Electrones Transistores Paladio Electrodos Aleaciones de níquel Electrostática AIP Publishing 2014 application/pdf eng article In situ electrical characterization of palladium-based single electron transistors made by electromigration technique http://www-biblio.inti.gob.ar:80/gsdl/collect/inti/index/assoc/HASH01cf/75392c65.dir/doc.pdf
institution Instituto Nacional de Tecnología Industrial (INTI)
institution_str I-60
repository_str R-166
collection Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
language Inglés
orig_language_str_mv eng
topic Electricidad
Electrones
Transistores
Paladio
Electrodos
Aleaciones de níquel
Electrostática
spellingShingle Electricidad
Electrones
Transistores
Paladio
Electrodos
Aleaciones de níquel
Electrostática
Arzubiaga, L.
Golmar, F.
Llopis, R.
Casanova, F.
Hueso, L. E.
In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
topic_facet Electricidad
Electrones
Transistores
Paladio
Electrodos
Aleaciones de níquel
Electrostática
format article
author Arzubiaga, L.
Golmar, F.
Llopis, R.
Casanova, F.
Hueso, L. E.
author_facet Arzubiaga, L.
Golmar, F.
Llopis, R.
Casanova, F.
Hueso, L. E.
author_sort Arzubiaga, L.
title In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
title_short In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
title_full In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
title_fullStr In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
title_full_unstemmed In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
title_sort in situ electrical characterization of palladium-based single electron transistors made by electromigration technique
publisher AIP Publishing
publishDate 2014
url http://www-biblio.inti.gob.ar:80/gsdl/collect/inti/index/assoc/HASH01cf/75392c65.dir/doc.pdf
work_keys_str_mv AT arzubiagal insituelectricalcharacterizationofpalladiumbasedsingleelectrontransistorsmadebyelectromigrationtechnique
AT golmarf insituelectricalcharacterizationofpalladiumbasedsingleelectrontransistorsmadebyelectromigrationtechnique
AT llopisr insituelectricalcharacterizationofpalladiumbasedsingleelectrontransistorsmadebyelectromigrationtechnique
AT casanovaf insituelectricalcharacterizationofpalladiumbasedsingleelectrontransistorsmadebyelectromigrationtechnique
AT huesole insituelectricalcharacterizationofpalladiumbasedsingleelectrontransistorsmadebyelectromigrationtechnique
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