Optical and electrical properties of nanostructured metallic electrical contacts
We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical...
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| Formato: | Artículo |
| Lenguaje: | Inglés |
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IOP Publishing Ltd
2021
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| Acceso en línea: | http://repositorio.unne.edu.ar/handle/123456789/28082 |
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I48-R184-123456789-28082 |
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I48-R184-123456789-280822025-03-06T10:58:21Z Optical and electrical properties of nanostructured metallic electrical contacts Toranzos, Víctor José Ortiz, Guillermo Pablo Mochán, W. Luis Zerbino, Jorge O. Hotspots Effective media Recursive algorithms We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rs 2.7 max ≈ Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones. 2021-06-07T22:21:42Z 2021-06-07T22:21:42Z 2017 Artículo Toranzos, Víctor José, et al., 2017. Optical and electrical properties of nanostructured metallic electrical contacts. Materials Research Express. United Kingdom: IOP Publishing Ltd, vol. 4, no. 1, p. 1-11. ISSN 2053-1591. 2053-1591 http://repositorio.unne.edu.ar/handle/123456789/28082 eng openAccess http://creativecommons.org/licenses/by-nc-nd/2.5/ar/ application/pdf application/pdf IOP Publishing Ltd Materials Research Express, 2017, vol. 4, no. 1, p. 1-11. |
| institution |
Universidad Nacional del Nordeste |
| institution_str |
I-48 |
| repository_str |
R-184 |
| collection |
RIUNNE - Repositorio Institucional de la Universidad Nacional del Nordeste (UNNE) |
| language |
Inglés |
| topic |
Hotspots Effective media Recursive algorithms |
| spellingShingle |
Hotspots Effective media Recursive algorithms Toranzos, Víctor José Ortiz, Guillermo Pablo Mochán, W. Luis Zerbino, Jorge O. Optical and electrical properties of nanostructured metallic electrical contacts |
| topic_facet |
Hotspots Effective media Recursive algorithms |
| description |
We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rs 2.7 max ≈ Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones. |
| format |
Artículo |
| author |
Toranzos, Víctor José Ortiz, Guillermo Pablo Mochán, W. Luis Zerbino, Jorge O. |
| author_facet |
Toranzos, Víctor José Ortiz, Guillermo Pablo Mochán, W. Luis Zerbino, Jorge O. |
| author_sort |
Toranzos, Víctor José |
| title |
Optical and electrical properties of nanostructured metallic electrical contacts |
| title_short |
Optical and electrical properties of nanostructured metallic electrical contacts |
| title_full |
Optical and electrical properties of nanostructured metallic electrical contacts |
| title_fullStr |
Optical and electrical properties of nanostructured metallic electrical contacts |
| title_full_unstemmed |
Optical and electrical properties of nanostructured metallic electrical contacts |
| title_sort |
optical and electrical properties of nanostructured metallic electrical contacts |
| publisher |
IOP Publishing Ltd |
| publishDate |
2021 |
| url |
http://repositorio.unne.edu.ar/handle/123456789/28082 |
| work_keys_str_mv |
AT toranzosvictorjose opticalandelectricalpropertiesofnanostructuredmetallicelectricalcontacts AT ortizguillermopablo opticalandelectricalpropertiesofnanostructuredmetallicelectricalcontacts AT mochanwluis opticalandelectricalpropertiesofnanostructuredmetallicelectricalcontacts AT zerbinojorgeo opticalandelectricalpropertiesofnanostructuredmetallicelectricalcontacts |
| _version_ |
1832343967636652032 |