Statistical analysis of a mixed-layer x-ray diffraction peak
A mathematical model to describe the line shape of an x-ray diffraction peak from stacks of different layers such as, for instance, an interstratified clay mineral has been evolved. The aim was to be able to analyse the proportions of different specific stacking sequences in two-component interstrat...
Guardado en:
Autores principales: | , , , , , |
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Formato: | Articulo |
Lenguaje: | Inglés |
Publicado: |
1997
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Materias: | |
Acceso en línea: | http://sedici.unlp.edu.ar/handle/10915/122878 |
Aporte de: |
id |
I19-R120-10915-122878 |
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record_format |
dspace |
institution |
Universidad Nacional de La Plata |
institution_str |
I-19 |
repository_str |
R-120 |
collection |
SEDICI (UNLP) |
language |
Inglés |
topic |
Ciencias Exactas Mixed layer Line (formation) Chemistry Mineralogy Diffraction Illite Stacking Clay minerals X-ray crystallography Mathematical model |
spellingShingle |
Ciencias Exactas Mixed layer Line (formation) Chemistry Mineralogy Diffraction Illite Stacking Clay minerals X-ray crystallography Mathematical model Rebollo Neira, Laura Constantinides, Anthony G. Plastino, Ángel Luis Álvarez, Alberto Guillermo Bonetto, Rita Dominga Iñíguez Rodríguez, Adrián Mario Statistical analysis of a mixed-layer x-ray diffraction peak |
topic_facet |
Ciencias Exactas Mixed layer Line (formation) Chemistry Mineralogy Diffraction Illite Stacking Clay minerals X-ray crystallography Mathematical model |
description |
A mathematical model to describe the line shape of an x-ray diffraction peak from stacks of different layers such as, for instance, an interstratified clay mineral has been evolved. The aim was to be able to analyse the proportions of different specific stacking sequences in two-component interstratified samples. A maximum-entropy algorithm was applied to observed powder-diffraction intensities in order to obtain the probability of each stacking sequence. Application to natural smectite-illite clays gave reasonable results. |
format |
Articulo Articulo |
author |
Rebollo Neira, Laura Constantinides, Anthony G. Plastino, Ángel Luis Álvarez, Alberto Guillermo Bonetto, Rita Dominga Iñíguez Rodríguez, Adrián Mario |
author_facet |
Rebollo Neira, Laura Constantinides, Anthony G. Plastino, Ángel Luis Álvarez, Alberto Guillermo Bonetto, Rita Dominga Iñíguez Rodríguez, Adrián Mario |
author_sort |
Rebollo Neira, Laura |
title |
Statistical analysis of a mixed-layer x-ray diffraction peak |
title_short |
Statistical analysis of a mixed-layer x-ray diffraction peak |
title_full |
Statistical analysis of a mixed-layer x-ray diffraction peak |
title_fullStr |
Statistical analysis of a mixed-layer x-ray diffraction peak |
title_full_unstemmed |
Statistical analysis of a mixed-layer x-ray diffraction peak |
title_sort |
statistical analysis of a mixed-layer x-ray diffraction peak |
publishDate |
1997 |
url |
http://sedici.unlp.edu.ar/handle/10915/122878 |
work_keys_str_mv |
AT rebolloneiralaura statisticalanalysisofamixedlayerxraydiffractionpeak AT constantinidesanthonyg statisticalanalysisofamixedlayerxraydiffractionpeak AT plastinoangelluis statisticalanalysisofamixedlayerxraydiffractionpeak AT alvarezalbertoguillermo statisticalanalysisofamixedlayerxraydiffractionpeak AT bonettoritadominga statisticalanalysisofamixedlayerxraydiffractionpeak AT iniguezrodriguezadrianmario statisticalanalysisofamixedlayerxraydiffractionpeak |
bdutipo_str |
Repositorios |
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1764820449380794369 |