Statistical analysis of a mixed-layer x-ray diffraction peak

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A mathematical model to describe the line shape of an x-ray diffraction peak from stacks of different layers such as, for instance, an interstratified clay mineral has been evolved. The aim was to be able to analyse the proportions of different specific stacking sequences in two-component interstrat...

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Autores principales: Rebollo Neira, Laura, Constantinides, Anthony G., Plastino, Ángel Luis, Álvarez, Alberto Guillermo, Bonetto, Rita Dominga, Iñíguez Rodríguez, Adrián Mario
Formato: Articulo
Lenguaje:Inglés
Publicado: 1997
Materias:
Ciencias Exactas
Mixed layer
Line (formation)
Chemistry
Mineralogy
Diffraction
Illite
Stacking
Clay minerals
X-ray crystallography
Mathematical model
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/122878
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
id I19-R120-10915-122878
record_format dspace
institution Universidad Nacional de La Plata
institution_str I-19
repository_str R-120
collection SEDICI (UNLP)
language Inglés
topic Ciencias Exactas
Mixed layer
Line (formation)
Chemistry
Mineralogy
Diffraction
Illite
Stacking
Clay minerals
X-ray crystallography
Mathematical model
spellingShingle Ciencias Exactas
Mixed layer
Line (formation)
Chemistry
Mineralogy
Diffraction
Illite
Stacking
Clay minerals
X-ray crystallography
Mathematical model
Rebollo Neira, Laura
Constantinides, Anthony G.
Plastino, Ángel Luis
Álvarez, Alberto Guillermo
Bonetto, Rita Dominga
Iñíguez Rodríguez, Adrián Mario
Statistical analysis of a mixed-layer x-ray diffraction peak
topic_facet Ciencias Exactas
Mixed layer
Line (formation)
Chemistry
Mineralogy
Diffraction
Illite
Stacking
Clay minerals
X-ray crystallography
Mathematical model
description A mathematical model to describe the line shape of an x-ray diffraction peak from stacks of different layers such as, for instance, an interstratified clay mineral has been evolved. The aim was to be able to analyse the proportions of different specific stacking sequences in two-component interstratified samples. A maximum-entropy algorithm was applied to observed powder-diffraction intensities in order to obtain the probability of each stacking sequence. Application to natural smectite-illite clays gave reasonable results.
format Articulo
Articulo
author Rebollo Neira, Laura
Constantinides, Anthony G.
Plastino, Ángel Luis
Álvarez, Alberto Guillermo
Bonetto, Rita Dominga
Iñíguez Rodríguez, Adrián Mario
author_facet Rebollo Neira, Laura
Constantinides, Anthony G.
Plastino, Ángel Luis
Álvarez, Alberto Guillermo
Bonetto, Rita Dominga
Iñíguez Rodríguez, Adrián Mario
author_sort Rebollo Neira, Laura
title Statistical analysis of a mixed-layer x-ray diffraction peak
title_short Statistical analysis of a mixed-layer x-ray diffraction peak
title_full Statistical analysis of a mixed-layer x-ray diffraction peak
title_fullStr Statistical analysis of a mixed-layer x-ray diffraction peak
title_full_unstemmed Statistical analysis of a mixed-layer x-ray diffraction peak
title_sort statistical analysis of a mixed-layer x-ray diffraction peak
publishDate 1997
url http://sedici.unlp.edu.ar/handle/10915/122878
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