Assisted scanning tunneling microscopy with visible polarized laser light

Mostrar todas las versiones(2)

Laser-assisted scanning tunneling microscopy (STM) has been used in recent years to obtain new information about surfaces properties in atomic scale. The authors have performed an experiment using a tungsten tip and highly oriented pyrolytic graphite (HOPG) as the sample. The tip-sample interface wa...

Descripción completa

Guardado en:

Detalles Bibliográficos
Autores principales:	Bragas, A.V., Landi, S.M., Coy, J.A., Martinez, O.E.
Formato:	JOUR
Materias:	Current voltage characteristics Electric breakdown Electric fields Electron tunneling Frequency modulation Graphite Helium neon lasers Laser beam effects Light polarization Photons Surface properties Tungsten Atomic resolution Current rectification Electron photon interaction Highly oriented pyrolytic graphite Laser induced signal Photothermal current Rectification signal Tunneling current Scanning tunneling microscopy
Acceso en línea:	http://hdl.handle.net/20.500.12110/paper_NIS18908_v9_n_p51_Bragas
Aporte de:	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

id	todo:paper_NIS18908_v9_n_p51_Bragas
record_format	dspace
spelling	todo:paper_NIS18908_v9_n_p51_Bragas2023-10-03T16:46:15Z Assisted scanning tunneling microscopy with visible polarized laser light Bragas, A.V. Landi, S.M. Coy, J.A. Martinez, O.E. Current voltage characteristics Electric breakdown Electric fields Electron tunneling Frequency modulation Graphite Helium neon lasers Laser beam effects Light polarization Photons Surface properties Tungsten Atomic resolution Current rectification Electron photon interaction Highly oriented pyrolytic graphite Laser induced signal Photothermal current Rectification signal Tunneling current Scanning tunneling microscopy Laser-assisted scanning tunneling microscopy (STM) has been used in recent years to obtain new information about surfaces properties in atomic scale. The authors have performed an experiment using a tungsten tip and highly oriented pyrolytic graphite (HOPG) as the sample. The tip-sample interface was illuminated with an He-Ne laser polarized in the s and p directions. To discriminate laser-induced signal from the background tunneling current, lock-in detection was used. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_NIS18908_v9_n_p51_Bragas
institution	Universidad de Buenos Aires
institution_str	I-28
repository_str	R-134
collection	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic	Current voltage characteristics Electric breakdown Electric fields Electron tunneling Frequency modulation Graphite Helium neon lasers Laser beam effects Light polarization Photons Surface properties Tungsten Atomic resolution Current rectification Electron photon interaction Highly oriented pyrolytic graphite Laser induced signal Photothermal current Rectification signal Tunneling current Scanning tunneling microscopy
spellingShingle	Current voltage characteristics Electric breakdown Electric fields Electron tunneling Frequency modulation Graphite Helium neon lasers Laser beam effects Light polarization Photons Surface properties Tungsten Atomic resolution Current rectification Electron photon interaction Highly oriented pyrolytic graphite Laser induced signal Photothermal current Rectification signal Tunneling current Scanning tunneling microscopy Bragas, A.V. Landi, S.M. Coy, J.A. Martinez, O.E. Assisted scanning tunneling microscopy with visible polarized laser light
topic_facet	Current voltage characteristics Electric breakdown Electric fields Electron tunneling Frequency modulation Graphite Helium neon lasers Laser beam effects Light polarization Photons Surface properties Tungsten Atomic resolution Current rectification Electron photon interaction Highly oriented pyrolytic graphite Laser induced signal Photothermal current Rectification signal Tunneling current Scanning tunneling microscopy
description	Laser-assisted scanning tunneling microscopy (STM) has been used in recent years to obtain new information about surfaces properties in atomic scale. The authors have performed an experiment using a tungsten tip and highly oriented pyrolytic graphite (HOPG) as the sample. The tip-sample interface was illuminated with an He-Ne laser polarized in the s and p directions. To discriminate laser-induced signal from the background tunneling current, lock-in detection was used.
format	JOUR
author	Bragas, A.V. Landi, S.M. Coy, J.A. Martinez, O.E.
author_facet	Bragas, A.V. Landi, S.M. Coy, J.A. Martinez, O.E.
author_sort	Bragas, A.V.
title	Assisted scanning tunneling microscopy with visible polarized laser light
title_short	Assisted scanning tunneling microscopy with visible polarized laser light
title_full	Assisted scanning tunneling microscopy with visible polarized laser light
title_fullStr	Assisted scanning tunneling microscopy with visible polarized laser light
title_full_unstemmed	Assisted scanning tunneling microscopy with visible polarized laser light
title_sort	assisted scanning tunneling microscopy with visible polarized laser light
url	http://hdl.handle.net/20.500.12110/paper_NIS18908_v9_n_p51_Bragas
work_keys_str_mv	AT bragasav assistedscanningtunnelingmicroscopywithvisiblepolarizedlaserlight AT landism assistedscanningtunnelingmicroscopywithvisiblepolarizedlaserlight AT coyja assistedscanningtunnelingmicroscopywithvisiblepolarizedlaserlight AT martinezoe assistedscanningtunnelingmicroscopywithvisiblepolarizedlaserlight
_version_	1807317086131716096

Assisted scanning tunneling microscopy with visible polarized laser light

Ejemplares similares