Optical testing by using the chromatic split of non-classical localization planes

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When a spatially incoherent, periodic, quasi-monochromatic source illuminates a two-beam amplitude division interferometer verifying the equivalent sine condition, successive non-classical localization planes appear. If the radiation is polychromatic, then each plane splits and the plane correspondi...

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Detalles Bibliográficos
Autores principales: Comastri, S.A., Simon, J.M., Echarri, R.M.
Formato: JOUR
Materias:
Interferometry
Non-classical localization planes
White light
Interferometers
Light sources
Optical filters
Prisms
Optical testing
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_14644258_v5_n5_pS342_Comastri
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id todo:paper_14644258_v5_n5_pS342_Comastri
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spelling todo:paper_14644258_v5_n5_pS342_Comastri2023-10-03T16:17:13Z Optical testing by using the chromatic split of non-classical localization planes Comastri, S.A. Simon, J.M. Echarri, R.M. Interferometry Non-classical localization planes White light Interferometers Interferometry Light sources Optical filters Prisms Non-classical localization planes Optical testing When a spatially incoherent, periodic, quasi-monochromatic source illuminates a two-beam amplitude division interferometer verifying the equivalent sine condition, successive non-classical localization planes appear. If the radiation is polychromatic, then each plane splits and the plane corresponding to a given wavelength can be viewed distinctly by interposing an adequate filter. Thus, by interchanging filters and with no other change in the configuration, a non-classical localization plane is shifted. In the present paper this shift is employed to examine various transversal planes of a thick transparent specimen with a few phase disturbances distributed in its volume. Results obtained with a Wollaston prism are shown. Fil:Comastri, S.A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Simon, J.M. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Echarri, R.M. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_14644258_v5_n5_pS342_Comastri
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Interferometry
Non-classical localization planes
White light
Interferometers
Interferometry
Light sources
Optical filters
Prisms
Non-classical localization planes
Optical testing
spellingShingle Interferometry
Non-classical localization planes
White light
Interferometers
Interferometry
Light sources
Optical filters
Prisms
Non-classical localization planes
Optical testing
Comastri, S.A.
Simon, J.M.
Echarri, R.M.
Optical testing by using the chromatic split of non-classical localization planes
topic_facet Interferometry
Non-classical localization planes
White light
Interferometers
Interferometry
Light sources
Optical filters
Prisms
Non-classical localization planes
Optical testing
description When a spatially incoherent, periodic, quasi-monochromatic source illuminates a two-beam amplitude division interferometer verifying the equivalent sine condition, successive non-classical localization planes appear. If the radiation is polychromatic, then each plane splits and the plane corresponding to a given wavelength can be viewed distinctly by interposing an adequate filter. Thus, by interchanging filters and with no other change in the configuration, a non-classical localization plane is shifted. In the present paper this shift is employed to examine various transversal planes of a thick transparent specimen with a few phase disturbances distributed in its volume. Results obtained with a Wollaston prism are shown.
format JOUR
author Comastri, S.A.
Simon, J.M.
Echarri, R.M.
author_facet Comastri, S.A.
Simon, J.M.
Echarri, R.M.
author_sort Comastri, S.A.
title Optical testing by using the chromatic split of non-classical localization planes
title_short Optical testing by using the chromatic split of non-classical localization planes
title_full Optical testing by using the chromatic split of non-classical localization planes
title_fullStr Optical testing by using the chromatic split of non-classical localization planes
title_full_unstemmed Optical testing by using the chromatic split of non-classical localization planes
title_sort optical testing by using the chromatic split of non-classical localization planes
url http://hdl.handle.net/20.500.12110/paper_14644258_v5_n5_pS342_Comastri
work_keys_str_mv AT comastrisa opticaltestingbyusingthechromaticsplitofnonclassicallocalizationplanes
AT simonjm opticaltestingbyusingthechromaticsplitofnonclassicallocalizationplanes
AT echarrirm opticaltestingbyusingthechromaticsplitofnonclassicallocalizationplanes
_version_ 1807320988633792512

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