Improving image contrast in fluorescence microscopy with nanostructured substrates
Metallic and dielectric nanostructures can show sharp contrasted resonances, sensitive to the environment, and high field enhancement in sub-wavelength volumes. For this reason, these structures are commonly used as molecular sensors. Only few works have focused on their application in optical micro...
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Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_10944087_v23_n23_p29772_Brunstein |
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todo:paper_10944087_v23_n23_p29772_Brunstein2023-10-03T16:05:14Z Improving image contrast in fluorescence microscopy with nanostructured substrates Brunstein, M. Cattoni, A. Estrada, L. Yacomotti, A.M. Fluorescence Fluorescence microscopy Nanostructures Refractive index Titanium dioxide Axial resolutions Background noise Fluorescence excitation Metallodielectric Molecular sensors Nanostructured substrates Nanostructured TiO Total internal reflections Substrates Metallic and dielectric nanostructures can show sharp contrasted resonances, sensitive to the environment, and high field enhancement in sub-wavelength volumes. For this reason, these structures are commonly used as molecular sensors. Only few works have focused on their application in optical microscopy, in particular in superresolution. In this work we have designed, fabricated and optically tested a nanostructured TiO2 substrate, fabricated by direct embossing of TiO2 derived film, as a substrate for fluorescence microscopy. Moreover, using numerical simulations, we have compared the signal to background noise with respect to other metallo-dielectric structures. We show that the TiO2 structure is a good candidate for reducing the thickness of the fluorescence excitation down to ∼100 nm. Therefore, this substrate can be used to obtain Total Internal Reflection (TIRF) axial resolution without a TIRF-Microscopy system. ©2015 Optical Society of America. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_10944087_v23_n23_p29772_Brunstein |
institution |
Universidad de Buenos Aires |
institution_str |
I-28 |
repository_str |
R-134 |
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Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) |
topic |
Fluorescence Fluorescence microscopy Nanostructures Refractive index Titanium dioxide Axial resolutions Background noise Fluorescence excitation Metallodielectric Molecular sensors Nanostructured substrates Nanostructured TiO Total internal reflections Substrates |
spellingShingle |
Fluorescence Fluorescence microscopy Nanostructures Refractive index Titanium dioxide Axial resolutions Background noise Fluorescence excitation Metallodielectric Molecular sensors Nanostructured substrates Nanostructured TiO Total internal reflections Substrates Brunstein, M. Cattoni, A. Estrada, L. Yacomotti, A.M. Improving image contrast in fluorescence microscopy with nanostructured substrates |
topic_facet |
Fluorescence Fluorescence microscopy Nanostructures Refractive index Titanium dioxide Axial resolutions Background noise Fluorescence excitation Metallodielectric Molecular sensors Nanostructured substrates Nanostructured TiO Total internal reflections Substrates |
description |
Metallic and dielectric nanostructures can show sharp contrasted resonances, sensitive to the environment, and high field enhancement in sub-wavelength volumes. For this reason, these structures are commonly used as molecular sensors. Only few works have focused on their application in optical microscopy, in particular in superresolution. In this work we have designed, fabricated and optically tested a nanostructured TiO2 substrate, fabricated by direct embossing of TiO2 derived film, as a substrate for fluorescence microscopy. Moreover, using numerical simulations, we have compared the signal to background noise with respect to other metallo-dielectric structures. We show that the TiO2 structure is a good candidate for reducing the thickness of the fluorescence excitation down to ∼100 nm. Therefore, this substrate can be used to obtain Total Internal Reflection (TIRF) axial resolution without a TIRF-Microscopy system. ©2015 Optical Society of America. |
format |
JOUR |
author |
Brunstein, M. Cattoni, A. Estrada, L. Yacomotti, A.M. |
author_facet |
Brunstein, M. Cattoni, A. Estrada, L. Yacomotti, A.M. |
author_sort |
Brunstein, M. |
title |
Improving image contrast in fluorescence microscopy with nanostructured substrates |
title_short |
Improving image contrast in fluorescence microscopy with nanostructured substrates |
title_full |
Improving image contrast in fluorescence microscopy with nanostructured substrates |
title_fullStr |
Improving image contrast in fluorescence microscopy with nanostructured substrates |
title_full_unstemmed |
Improving image contrast in fluorescence microscopy with nanostructured substrates |
title_sort |
improving image contrast in fluorescence microscopy with nanostructured substrates |
url |
http://hdl.handle.net/20.500.12110/paper_10944087_v23_n23_p29772_Brunstein |
work_keys_str_mv |
AT brunsteinm improvingimagecontrastinfluorescencemicroscopywithnanostructuredsubstrates AT cattonia improvingimagecontrastinfluorescencemicroscopywithnanostructuredsubstrates AT estradal improvingimagecontrastinfluorescencemicroscopywithnanostructuredsubstrates AT yacomottiam improvingimagecontrastinfluorescencemicroscopywithnanostructuredsubstrates |
_version_ |
1807317580026740736 |