Improving image contrast in fluorescence microscopy with nanostructured substrates

Metallic and dielectric nanostructures can show sharp contrasted resonances, sensitive to the environment, and high field enhancement in sub-wavelength volumes. For this reason, these structures are commonly used as molecular sensors. Only few works have focused on their application in optical micro...

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Autores principales: Brunstein, M., Cattoni, A., Estrada, L., Yacomotti, A.M.
Formato: JOUR
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Acceso en línea:http://hdl.handle.net/20.500.12110/paper_10944087_v23_n23_p29772_Brunstein
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spelling todo:paper_10944087_v23_n23_p29772_Brunstein2023-10-03T16:05:14Z Improving image contrast in fluorescence microscopy with nanostructured substrates Brunstein, M. Cattoni, A. Estrada, L. Yacomotti, A.M. Fluorescence Fluorescence microscopy Nanostructures Refractive index Titanium dioxide Axial resolutions Background noise Fluorescence excitation Metallodielectric Molecular sensors Nanostructured substrates Nanostructured TiO Total internal reflections Substrates Metallic and dielectric nanostructures can show sharp contrasted resonances, sensitive to the environment, and high field enhancement in sub-wavelength volumes. For this reason, these structures are commonly used as molecular sensors. Only few works have focused on their application in optical microscopy, in particular in superresolution. In this work we have designed, fabricated and optically tested a nanostructured TiO2 substrate, fabricated by direct embossing of TiO2 derived film, as a substrate for fluorescence microscopy. Moreover, using numerical simulations, we have compared the signal to background noise with respect to other metallo-dielectric structures. We show that the TiO2 structure is a good candidate for reducing the thickness of the fluorescence excitation down to ∼100 nm. Therefore, this substrate can be used to obtain Total Internal Reflection (TIRF) axial resolution without a TIRF-Microscopy system. ©2015 Optical Society of America. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_10944087_v23_n23_p29772_Brunstein
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Fluorescence
Fluorescence microscopy
Nanostructures
Refractive index
Titanium dioxide
Axial resolutions
Background noise
Fluorescence excitation
Metallodielectric
Molecular sensors
Nanostructured substrates
Nanostructured TiO
Total internal reflections
Substrates
spellingShingle Fluorescence
Fluorescence microscopy
Nanostructures
Refractive index
Titanium dioxide
Axial resolutions
Background noise
Fluorescence excitation
Metallodielectric
Molecular sensors
Nanostructured substrates
Nanostructured TiO
Total internal reflections
Substrates
Brunstein, M.
Cattoni, A.
Estrada, L.
Yacomotti, A.M.
Improving image contrast in fluorescence microscopy with nanostructured substrates
topic_facet Fluorescence
Fluorescence microscopy
Nanostructures
Refractive index
Titanium dioxide
Axial resolutions
Background noise
Fluorescence excitation
Metallodielectric
Molecular sensors
Nanostructured substrates
Nanostructured TiO
Total internal reflections
Substrates
description Metallic and dielectric nanostructures can show sharp contrasted resonances, sensitive to the environment, and high field enhancement in sub-wavelength volumes. For this reason, these structures are commonly used as molecular sensors. Only few works have focused on their application in optical microscopy, in particular in superresolution. In this work we have designed, fabricated and optically tested a nanostructured TiO2 substrate, fabricated by direct embossing of TiO2 derived film, as a substrate for fluorescence microscopy. Moreover, using numerical simulations, we have compared the signal to background noise with respect to other metallo-dielectric structures. We show that the TiO2 structure is a good candidate for reducing the thickness of the fluorescence excitation down to ∼100 nm. Therefore, this substrate can be used to obtain Total Internal Reflection (TIRF) axial resolution without a TIRF-Microscopy system. ©2015 Optical Society of America.
format JOUR
author Brunstein, M.
Cattoni, A.
Estrada, L.
Yacomotti, A.M.
author_facet Brunstein, M.
Cattoni, A.
Estrada, L.
Yacomotti, A.M.
author_sort Brunstein, M.
title Improving image contrast in fluorescence microscopy with nanostructured substrates
title_short Improving image contrast in fluorescence microscopy with nanostructured substrates
title_full Improving image contrast in fluorescence microscopy with nanostructured substrates
title_fullStr Improving image contrast in fluorescence microscopy with nanostructured substrates
title_full_unstemmed Improving image contrast in fluorescence microscopy with nanostructured substrates
title_sort improving image contrast in fluorescence microscopy with nanostructured substrates
url http://hdl.handle.net/20.500.12110/paper_10944087_v23_n23_p29772_Brunstein
work_keys_str_mv AT brunsteinm improvingimagecontrastinfluorescencemicroscopywithnanostructuredsubstrates
AT cattonia improvingimagecontrastinfluorescencemicroscopywithnanostructuredsubstrates
AT estradal improvingimagecontrastinfluorescencemicroscopywithnanostructuredsubstrates
AT yacomottiam improvingimagecontrastinfluorescencemicroscopywithnanostructuredsubstrates
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