Optical testing by the use of the chromatic split of non-classical localization planes
When a spatially incoherent, periodic, quasi-monochromatic source illuminates an amplitude division two beam interferometer verifying the equivalent sine condition, successive non-classical localization planes appear. If the radiation is polichromatic each plane splits and that corresponding to a gi...
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| Autores principales: | , , |
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| Formato: | CONF |
| Materias: | |
| Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_0277786X_v4829I_n_p172_Comastri |
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| Sumario: | When a spatially incoherent, periodic, quasi-monochromatic source illuminates an amplitude division two beam interferometer verifying the equivalent sine condition, successive non-classical localization planes appear. If the radiation is polichromatic each plane splits and that corresponding to a given wavelength can be distinctly viewed interposing an adequate filter. Thus interchanging filters and with no other change in the configuration, a non-classical localization plane shifts. In the present paper this shift is employed to examine various transversal planes of a thick transparent specimen with a few phase disturbances distributed in its volume. Results obtained with a Wollaston prism are shown. |
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