Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization

In this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diff...

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Autores principales: Domené, E.A., Mingolo, N., Martínez, O.E.
Formato: CONF
Materias:
Probes
Thermal diffusivity
Defocusing
Detection scheme
Micro-structural characterization
Microscopic levels
Pump modulation
Sample surface
Surface curvatures
Surface deformation
Thermal expansion
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_02729172_v1526_n_p47_Domene
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id todo:paper_02729172_v1526_n_p47_Domene
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spelling todo:paper_02729172_v1526_n_p47_Domene2023-10-03T15:15:26Z Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization Domené, E.A. Mingolo, N. Martínez, O.E. Probes Thermal diffusivity Defocusing Detection scheme Micro-structural characterization Microscopic levels Pump modulation Sample surface Surface curvatures Surface deformation Thermal expansion In this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diffusivity at microscopic levels, hence mapping such magnitude over a sample surface. The induced thermal expansion defocuses the probe beam due to the surface deformation (curvature). The dependence of the defocusing with the pump modulation frequency yields the thermal diffusivity of the sample at the impinging location. The explored depth is controlled by the pump beam size. By scanning both beams, a complete map of the thermal diffusivity can be retrieved. © 2013 Materials Research Society. Fil:Domené, E.A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Mingolo, N. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Martínez, O.E. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. CONF info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_02729172_v1526_n_p47_Domene
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Probes
Thermal diffusivity
Defocusing
Detection scheme
Micro-structural characterization
Microscopic levels
Pump modulation
Sample surface
Surface curvatures
Surface deformation
Thermal expansion
spellingShingle Probes
Thermal diffusivity
Defocusing
Detection scheme
Micro-structural characterization
Microscopic levels
Pump modulation
Sample surface
Surface curvatures
Surface deformation
Thermal expansion
Domené, E.A.
Mingolo, N.
Martínez, O.E.
Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
topic_facet Probes
Thermal diffusivity
Defocusing
Detection scheme
Micro-structural characterization
Microscopic levels
Pump modulation
Sample surface
Surface curvatures
Surface deformation
Thermal expansion
description In this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diffusivity at microscopic levels, hence mapping such magnitude over a sample surface. The induced thermal expansion defocuses the probe beam due to the surface deformation (curvature). The dependence of the defocusing with the pump modulation frequency yields the thermal diffusivity of the sample at the impinging location. The explored depth is controlled by the pump beam size. By scanning both beams, a complete map of the thermal diffusivity can be retrieved. © 2013 Materials Research Society.
format CONF
author Domené, E.A.
Mingolo, N.
Martínez, O.E.
author_facet Domené, E.A.
Mingolo, N.
Martínez, O.E.
author_sort Domené, E.A.
title Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
title_short Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
title_full Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
title_fullStr Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
title_full_unstemmed Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
title_sort thermal expansion-recovery microscopy (therm) for microstructural characterization
url http://hdl.handle.net/20.500.12110/paper_02729172_v1526_n_p47_Domene
work_keys_str_mv AT domeneea thermalexpansionrecoverymicroscopythermformicrostructuralcharacterization
AT mingolon thermalexpansionrecoverymicroscopythermformicrostructuralcharacterization
AT martinezoe thermalexpansionrecoverymicroscopythermformicrostructuralcharacterization
_version_ 1782027230942068736

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