A simple three step method for selective placement of organic groups in mesoporous silica thin films

Selective functionalization of mesoporous silica thin films was achieved using a three step method. The first step consists in an outer surface functionalization, followed by washing off the structuring agent (second step), leaving the inner surface of the pores free to be functionalized in the thir...

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Autores principales: Franceschini, E.A., Llave, E.D.L., Williams, F.J., Soler-Illia, G.J.A.A.
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Acceso en línea:http://hdl.handle.net/20.500.12110/paper_02540584_v169_n_p82_Franceschini
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spelling todo:paper_02540584_v169_n_p82_Franceschini2023-10-03T15:11:31Z A simple three step method for selective placement of organic groups in mesoporous silica thin films Franceschini, E.A. Llave, E.D.L. Williams, F.J. Soler-Illia, G.J.A.A. Nanostructures Sol-gel growth Surface properties Thin films Vapor deposition X-ray photo-emission spectroscopy (XPS) Deposition Emission spectroscopy Mesoporous materials Nanostructures Photoelectron spectroscopy Silica Sol-gels Surface properties Vapor deposition X ray photoelectron spectroscopy Ellipsometric porosimetry Functionalized silica Mesoporous silica film Mesoporous silica thin films Mesoporous thin films Selective functionalization Sol-gel growth X ray photoemission spectroscopy Thin films Selective functionalization of mesoporous silica thin films was achieved using a three step method. The first step consists in an outer surface functionalization, followed by washing off the structuring agent (second step), leaving the inner surface of the pores free to be functionalized in the third step. This reproducible method permits to anchor a volatile silane group in the outer film surface, and a second type of silane group in the inner surface of the pores. As a concept test we modified the outer surface of a mesoporous silica film with trimethylsilane (-Si-(CH3)3) groups and the inner pore surface with propylamino (-Si-(CH2)3-NH2) groups. The obtained silica films were characterized by Environmental Ellipsometric Porosimetry (EEP), EDS, XPS, contact angle and electron microscopy. The selectively functionalized silica (SF) shows an amount of surface amino functions 4.3 times lower than the one-step functionalized (OSF) silica samples. The method presented here can be extended to a combination of silane chlorides and alkoxides as functional groups, opening up a new route toward the synthesis of multifunctional mesoporous thin films with precisely localized organic functions. © 2015 Elsevier B.V. All rights reserved. Fil:Franceschini, E.A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Williams, F.J. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Soler-Illia, G.J.A.A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_02540584_v169_n_p82_Franceschini
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Nanostructures
Sol-gel growth
Surface properties
Thin films
Vapor deposition
X-ray photo-emission spectroscopy (XPS)
Deposition
Emission spectroscopy
Mesoporous materials
Nanostructures
Photoelectron spectroscopy
Silica
Sol-gels
Surface properties
Vapor deposition
X ray photoelectron spectroscopy
Ellipsometric porosimetry
Functionalized silica
Mesoporous silica film
Mesoporous silica thin films
Mesoporous thin films
Selective functionalization
Sol-gel growth
X ray photoemission spectroscopy
Thin films
spellingShingle Nanostructures
Sol-gel growth
Surface properties
Thin films
Vapor deposition
X-ray photo-emission spectroscopy (XPS)
Deposition
Emission spectroscopy
Mesoporous materials
Nanostructures
Photoelectron spectroscopy
Silica
Sol-gels
Surface properties
Vapor deposition
X ray photoelectron spectroscopy
Ellipsometric porosimetry
Functionalized silica
Mesoporous silica film
Mesoporous silica thin films
Mesoporous thin films
Selective functionalization
Sol-gel growth
X ray photoemission spectroscopy
Thin films
Franceschini, E.A.
Llave, E.D.L.
Williams, F.J.
Soler-Illia, G.J.A.A.
A simple three step method for selective placement of organic groups in mesoporous silica thin films
topic_facet Nanostructures
Sol-gel growth
Surface properties
Thin films
Vapor deposition
X-ray photo-emission spectroscopy (XPS)
Deposition
Emission spectroscopy
Mesoporous materials
Nanostructures
Photoelectron spectroscopy
Silica
Sol-gels
Surface properties
Vapor deposition
X ray photoelectron spectroscopy
Ellipsometric porosimetry
Functionalized silica
Mesoporous silica film
Mesoporous silica thin films
Mesoporous thin films
Selective functionalization
Sol-gel growth
X ray photoemission spectroscopy
Thin films
description Selective functionalization of mesoporous silica thin films was achieved using a three step method. The first step consists in an outer surface functionalization, followed by washing off the structuring agent (second step), leaving the inner surface of the pores free to be functionalized in the third step. This reproducible method permits to anchor a volatile silane group in the outer film surface, and a second type of silane group in the inner surface of the pores. As a concept test we modified the outer surface of a mesoporous silica film with trimethylsilane (-Si-(CH3)3) groups and the inner pore surface with propylamino (-Si-(CH2)3-NH2) groups. The obtained silica films were characterized by Environmental Ellipsometric Porosimetry (EEP), EDS, XPS, contact angle and electron microscopy. The selectively functionalized silica (SF) shows an amount of surface amino functions 4.3 times lower than the one-step functionalized (OSF) silica samples. The method presented here can be extended to a combination of silane chlorides and alkoxides as functional groups, opening up a new route toward the synthesis of multifunctional mesoporous thin films with precisely localized organic functions. © 2015 Elsevier B.V. All rights reserved.
format JOUR
author Franceschini, E.A.
Llave, E.D.L.
Williams, F.J.
Soler-Illia, G.J.A.A.
author_facet Franceschini, E.A.
Llave, E.D.L.
Williams, F.J.
Soler-Illia, G.J.A.A.
author_sort Franceschini, E.A.
title A simple three step method for selective placement of organic groups in mesoporous silica thin films
title_short A simple three step method for selective placement of organic groups in mesoporous silica thin films
title_full A simple three step method for selective placement of organic groups in mesoporous silica thin films
title_fullStr A simple three step method for selective placement of organic groups in mesoporous silica thin films
title_full_unstemmed A simple three step method for selective placement of organic groups in mesoporous silica thin films
title_sort simple three step method for selective placement of organic groups in mesoporous silica thin films
url http://hdl.handle.net/20.500.12110/paper_02540584_v169_n_p82_Franceschini
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