Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N2 pressure is reported. A Faraday Cup operating in the secondary electron emission mode was employed. To determine the total number of beam particles, multiple scatter...
Guardado en:
Autores principales: | Kelly, H., Lepone, A., Marquez, A., Sadowski, M.J., Baranowski, J., Skladnik-Sadowska, E. |
---|---|
Formato: | JOUR |
Materias: | |
Acceso en línea: | http://hdl.handle.net/20.500.12110/paper_00933813_v26_n1_p113_Kelly |
Aporte de: |
Ejemplares similares
-
Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
por: Kelly, Héctor Juan, et al.
Publicado: (1998) -
Comparison of characteristics of pulsed ion beams emitted from different small PF devices
por: Sadowski, M., et al. -
Comparison of characteristics of pulsed ion beams emitted from different small PF devices
Publicado: (2000) -
Nitrogen ion spectrum from a low energy plasma focus device
por: Kelly, H., et al. -
Nitrogen ion spectrum from a low energy plasma focus device
por: Kelly, Héctor Juan, et al.
Publicado: (1997)