Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N2 pressure is reported. A Faraday Cup operating in the secondary electron emission mode was employed. To determine the total number of beam particles, multiple scatter...
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todo:paper_00933813_v26_n1_p113_Kelly2023-10-03T14:55:30Z Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode Kelly, H. Lepone, A. Marquez, A. Sadowski, M.J. Baranowski, J. Skladnik-Sadowska, E. Faraday cup diagnostic Ion beams Ion energy spectral analysis Plasma focus Electron emission Ion beams Nitrogen Plasma diagnostics Spectrum analysis Faraday cup diagnostics Plasma focus (PF) devices Plasma devices The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N2 pressure is reported. A Faraday Cup operating in the secondary electron emission mode was employed. To determine the total number of beam particles, multiple scattering of the ions was taken into account. It has been possible to register the ion energy up to a lower kinetic energy threshold of 50 keV, which is a value much lower than that obtained with a Thomson spectrometer in a previous work. © 1998 IEEE. Fil:Kelly, H. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Lepone, A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Marquez, A. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00933813_v26_n1_p113_Kelly |
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Universidad de Buenos Aires |
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I-28 |
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R-134 |
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Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) |
| topic |
Faraday cup diagnostic Ion beams Ion energy spectral analysis Plasma focus Electron emission Ion beams Nitrogen Plasma diagnostics Spectrum analysis Faraday cup diagnostics Plasma focus (PF) devices Plasma devices |
| spellingShingle |
Faraday cup diagnostic Ion beams Ion energy spectral analysis Plasma focus Electron emission Ion beams Nitrogen Plasma diagnostics Spectrum analysis Faraday cup diagnostics Plasma focus (PF) devices Plasma devices Kelly, H. Lepone, A. Marquez, A. Sadowski, M.J. Baranowski, J. Skladnik-Sadowska, E. Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode |
| topic_facet |
Faraday cup diagnostic Ion beams Ion energy spectral analysis Plasma focus Electron emission Ion beams Nitrogen Plasma diagnostics Spectrum analysis Faraday cup diagnostics Plasma focus (PF) devices Plasma devices |
| description |
The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N2 pressure is reported. A Faraday Cup operating in the secondary electron emission mode was employed. To determine the total number of beam particles, multiple scattering of the ions was taken into account. It has been possible to register the ion energy up to a lower kinetic energy threshold of 50 keV, which is a value much lower than that obtained with a Thomson spectrometer in a previous work. © 1998 IEEE. |
| format |
JOUR |
| author |
Kelly, H. Lepone, A. Marquez, A. Sadowski, M.J. Baranowski, J. Skladnik-Sadowska, E. |
| author_facet |
Kelly, H. Lepone, A. Marquez, A. Sadowski, M.J. Baranowski, J. Skladnik-Sadowska, E. |
| author_sort |
Kelly, H. |
| title |
Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode |
| title_short |
Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode |
| title_full |
Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode |
| title_fullStr |
Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode |
| title_full_unstemmed |
Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode |
| title_sort |
analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode |
| url |
http://hdl.handle.net/20.500.12110/paper_00933813_v26_n1_p113_Kelly |
| work_keys_str_mv |
AT kellyh analysisofthenitrogenionbeamgeneratedinalowenergyplasmafocusdevicebyafaradaycupoperatinginthesecondaryelectronemissionmode AT leponea analysisofthenitrogenionbeamgeneratedinalowenergyplasmafocusdevicebyafaradaycupoperatinginthesecondaryelectronemissionmode AT marqueza analysisofthenitrogenionbeamgeneratedinalowenergyplasmafocusdevicebyafaradaycupoperatinginthesecondaryelectronemissionmode AT sadowskimj analysisofthenitrogenionbeamgeneratedinalowenergyplasmafocusdevicebyafaradaycupoperatinginthesecondaryelectronemissionmode AT baranowskij analysisofthenitrogenionbeamgeneratedinalowenergyplasmafocusdevicebyafaradaycupoperatinginthesecondaryelectronemissionmode AT skladniksadowskae analysisofthenitrogenionbeamgeneratedinalowenergyplasmafocusdevicebyafaradaycupoperatinginthesecondaryelectronemissionmode |
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1807323234136227840 |