Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy

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Field-enhanced scanning optical microscopy relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near-field information recorded in a field-enhanced scanning optical microscopy ex...

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Autores principales: Scarpettini, A.F., Bragas, A.V.
Formato: JOUR
Materias:
Enhancement factor
Harmonic demodulation
Scanning near-field optical microscopy
Article
field enhanced near field optical microscopy
frequency modulation
laser
mathematical analysis
mathematical computing
mathematical model
prediction
Raman spectrometry
scanning electron microscopy
signal detection
signal processing
Acceso en línea:http://hdl.handle.net/20.500.12110/paper_00222720_v257_n1_p54_Scarpettini
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
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spelling todo:paper_00222720_v257_n1_p54_Scarpettini2023-10-03T14:30:20Z Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy Scarpettini, A.F. Bragas, A.V. Enhancement factor Harmonic demodulation Scanning near-field optical microscopy Article field enhanced near field optical microscopy frequency modulation laser mathematical analysis mathematical computing mathematical model prediction Raman spectrometry scanning electron microscopy signal detection signal processing Field-enhanced scanning optical microscopy relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near-field information recorded in a field-enhanced scanning optical microscopy experiment, has to surpass the background light, always present due to multiple interferences between the macroscopic probe and sample. In this work, we show that when the probe-sample distance is modulated with very low amplitude, the higher the harmonic demodulation is, the better the ratio between the near-field signal and the interferometric background results. The choice of working at a given n harmonic is dictated by the experiment when the signal at the n + 1 harmonic goes below the experimental noise. We demonstrate that the optical contrast comes from the nth derivative of the near-field scattering, amplified by the interferometric background. By modelling the far and near field we calculate the probe-sample approach curves, which fit very well the experimental ones. After taking a great amount of experimental data for different probes and samples, we conclude with a table of the minimum enhancement factors needed to have optical contrast with field-enhanced scanning optical microscopy. © 2014 Royal Microscopical Society. Fil:Scarpettini, A.F. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Bragas, A.V. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00222720_v257_n1_p54_Scarpettini
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Enhancement factor
Harmonic demodulation
Scanning near-field optical microscopy
Article
field enhanced near field optical microscopy
frequency modulation
laser
mathematical analysis
mathematical computing
mathematical model
prediction
Raman spectrometry
scanning electron microscopy
signal detection
signal processing
spellingShingle Enhancement factor
Harmonic demodulation
Scanning near-field optical microscopy
Article
field enhanced near field optical microscopy
frequency modulation
laser
mathematical analysis
mathematical computing
mathematical model
prediction
Raman spectrometry
scanning electron microscopy
signal detection
signal processing
Scarpettini, A.F.
Bragas, A.V.
Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
topic_facet Enhancement factor
Harmonic demodulation
Scanning near-field optical microscopy
Article
field enhanced near field optical microscopy
frequency modulation
laser
mathematical analysis
mathematical computing
mathematical model
prediction
Raman spectrometry
scanning electron microscopy
signal detection
signal processing
description Field-enhanced scanning optical microscopy relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near-field information recorded in a field-enhanced scanning optical microscopy experiment, has to surpass the background light, always present due to multiple interferences between the macroscopic probe and sample. In this work, we show that when the probe-sample distance is modulated with very low amplitude, the higher the harmonic demodulation is, the better the ratio between the near-field signal and the interferometric background results. The choice of working at a given n harmonic is dictated by the experiment when the signal at the n + 1 harmonic goes below the experimental noise. We demonstrate that the optical contrast comes from the nth derivative of the near-field scattering, amplified by the interferometric background. By modelling the far and near field we calculate the probe-sample approach curves, which fit very well the experimental ones. After taking a great amount of experimental data for different probes and samples, we conclude with a table of the minimum enhancement factors needed to have optical contrast with field-enhanced scanning optical microscopy. © 2014 Royal Microscopical Society.
format JOUR
author Scarpettini, A.F.
Bragas, A.V.
author_facet Scarpettini, A.F.
Bragas, A.V.
author_sort Scarpettini, A.F.
title Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_short Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_full Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_fullStr Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_full_unstemmed Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_sort harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
url http://hdl.handle.net/20.500.12110/paper_00222720_v257_n1_p54_Scarpettini
work_keys_str_mv AT scarpettiniaf harmonicdemodulationandminimumenhancementfactorsinfieldenhancednearfieldopticalmicroscopy
AT bragasav harmonicdemodulationandminimumenhancementfactorsinfieldenhancednearfieldopticalmicroscopy
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