Effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation on the field emission properties of carbon nanotubes

The effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation of carbon nanotubes (CNTs) films on the chemical and electronic properties of the material is reported. The CNTs were grown by the chemical vapor deposition technique (CVD) on silicon TiN coated substrates previously decorated with Ni pa...

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Autores principales: Acua, J.J.S., Escobar, M., Goyanes, S.N., Candal, R.J., Zanatta, A.R., Alvarez, F.
Formato: JOUR
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Acceso en línea:http://hdl.handle.net/20.500.12110/paper_00218979_v109_n11_p_Acua
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spelling todo:paper_00218979_v109_n11_p_Acua2023-10-03T14:22:10Z Effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation on the field emission properties of carbon nanotubes Acua, J.J.S. Escobar, M. Goyanes, S.N. Candal, R.J. Zanatta, A.R. Alvarez, F. Chemical vapor Coated substrates Ex situ Experimental conditions Experimental data FEG-SEM Field emission measurements Field emission property Field-effect Fowler-Nordheim In-situ Ion beam irradiation Morphological changes NI particles Oxygen concentrations Quinone groups Structural characteristics TiN coating XPS data Carbon nanotubes Chemical vapor deposition Electron emission Electronic properties Field emission Ion beams Ions Oxygen Photoelectron spectroscopy Scanning electron microscopy Titanium nitride X ray photoelectron spectroscopy Irradiation The effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation of carbon nanotubes (CNTs) films on the chemical and electronic properties of the material is reported. The CNTs were grown by the chemical vapor deposition technique (CVD) on silicon TiN coated substrates previously decorated with Ni particles. The Ni decoration and TiN coating were successively deposited by ion-beam assisted deposition (IBAD) and afterwards the nanotubes were grown. The whole deposition procedure was performed in situ as well as the study of the effect of ion-beam irradiation on the CNTs by x-ray photoelectron spectroscopy (XPS). Raman scattering, field-effect emission gun scanning electron microscopy (FEG-SEM), and field emission (FE) measurements were performed ex situ. The experimental data show that: (a) the presence of either H2+ or N2 + ions in the irradiation beam determines the oxygen concentration remaining in the samples as well as the studied structural characteristics; (b) due to the experimental conditions used in the study, no morphological changes have been observed after irradiation of the CNTs; (c) the FE experiments indicate that the electron emission from the CNTs follows the Fowler-Nordheim model, and it is dependent on the oxygen concentration remaining in the samples; and (d) in association with FE results, the XPS data suggest that the formation of terminal quinone groups decreases the CNTs work function of the material. © 2011 American Institute of Physics. Fil:Escobar, M. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Goyanes, S.N. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Candal, R.J. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Alvarez, F. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. JOUR info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by/2.5/ar http://hdl.handle.net/20.500.12110/paper_00218979_v109_n11_p_Acua
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Chemical vapor
Coated substrates
Ex situ
Experimental conditions
Experimental data
FEG-SEM
Field emission measurements
Field emission property
Field-effect
Fowler-Nordheim
In-situ
Ion beam irradiation
Morphological changes
NI particles
Oxygen concentrations
Quinone groups
Structural characteristics
TiN coating
XPS data
Carbon nanotubes
Chemical vapor deposition
Electron emission
Electronic properties
Field emission
Ion beams
Ions
Oxygen
Photoelectron spectroscopy
Scanning electron microscopy
Titanium nitride
X ray photoelectron spectroscopy
Irradiation
spellingShingle Chemical vapor
Coated substrates
Ex situ
Experimental conditions
Experimental data
FEG-SEM
Field emission measurements
Field emission property
Field-effect
Fowler-Nordheim
In-situ
Ion beam irradiation
Morphological changes
NI particles
Oxygen concentrations
Quinone groups
Structural characteristics
TiN coating
XPS data
Carbon nanotubes
Chemical vapor deposition
Electron emission
Electronic properties
Field emission
Ion beams
Ions
Oxygen
Photoelectron spectroscopy
Scanning electron microscopy
Titanium nitride
X ray photoelectron spectroscopy
Irradiation
Acua, J.J.S.
Escobar, M.
Goyanes, S.N.
Candal, R.J.
Zanatta, A.R.
Alvarez, F.
Effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation on the field emission properties of carbon nanotubes
topic_facet Chemical vapor
Coated substrates
Ex situ
Experimental conditions
Experimental data
FEG-SEM
Field emission measurements
Field emission property
Field-effect
Fowler-Nordheim
In-situ
Ion beam irradiation
Morphological changes
NI particles
Oxygen concentrations
Quinone groups
Structural characteristics
TiN coating
XPS data
Carbon nanotubes
Chemical vapor deposition
Electron emission
Electronic properties
Field emission
Ion beams
Ions
Oxygen
Photoelectron spectroscopy
Scanning electron microscopy
Titanium nitride
X ray photoelectron spectroscopy
Irradiation
description The effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation of carbon nanotubes (CNTs) films on the chemical and electronic properties of the material is reported. The CNTs were grown by the chemical vapor deposition technique (CVD) on silicon TiN coated substrates previously decorated with Ni particles. The Ni decoration and TiN coating were successively deposited by ion-beam assisted deposition (IBAD) and afterwards the nanotubes were grown. The whole deposition procedure was performed in situ as well as the study of the effect of ion-beam irradiation on the CNTs by x-ray photoelectron spectroscopy (XPS). Raman scattering, field-effect emission gun scanning electron microscopy (FEG-SEM), and field emission (FE) measurements were performed ex situ. The experimental data show that: (a) the presence of either H2+ or N2 + ions in the irradiation beam determines the oxygen concentration remaining in the samples as well as the studied structural characteristics; (b) due to the experimental conditions used in the study, no morphological changes have been observed after irradiation of the CNTs; (c) the FE experiments indicate that the electron emission from the CNTs follows the Fowler-Nordheim model, and it is dependent on the oxygen concentration remaining in the samples; and (d) in association with FE results, the XPS data suggest that the formation of terminal quinone groups decreases the CNTs work function of the material. © 2011 American Institute of Physics.
format JOUR
author Acua, J.J.S.
Escobar, M.
Goyanes, S.N.
Candal, R.J.
Zanatta, A.R.
Alvarez, F.
author_facet Acua, J.J.S.
Escobar, M.
Goyanes, S.N.
Candal, R.J.
Zanatta, A.R.
Alvarez, F.
author_sort Acua, J.J.S.
title Effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation on the field emission properties of carbon nanotubes
title_short Effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation on the field emission properties of carbon nanotubes
title_full Effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation on the field emission properties of carbon nanotubes
title_fullStr Effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation on the field emission properties of carbon nanotubes
title_full_unstemmed Effect of O2+, H2+ O 2+, and N2+ O2 + ion-beam irradiation on the field emission properties of carbon nanotubes
title_sort effect of o2+, h2+ o 2+, and n2+ o2 + ion-beam irradiation on the field emission properties of carbon nanotubes
url http://hdl.handle.net/20.500.12110/paper_00218979_v109_n11_p_Acua
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