Marchi, M., Bilmes, S., Ribeiro, C., Ochoa, E., Kleinke, M., & Alvarez, F. A comprehensive study of the influence of the stoichiometry on the physical properties of TiO x films prepared by ion beam deposition.
Cita Chicago Style (17a ed.)Marchi, M.C, S.A Bilmes, C.T.M Ribeiro, E.A Ochoa, M. Kleinke, y F. Alvarez. A Comprehensive Study of the Influence of the Stoichiometry on the Physical Properties of TiO X Films Prepared by Ion Beam Deposition.
Cita MLA (8a ed.)Marchi, M.C, et al. A Comprehensive Study of the Influence of the Stoichiometry on the Physical Properties of TiO X Films Prepared by Ion Beam Deposition.
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