Assisted scanning tunneling microscopy with visible polarized laser light

Laser-assisted scanning tunneling microscopy (STM) has been used in recent years to obtain new information about surfaces properties in atomic scale. The authors have performed an experiment using a tungsten tip and highly oriented pyrolytic graphite (HOPG) as the sample. The tip-sample interface wa...

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Detalles Bibliográficos
Publicado: 1996
Materias:
Current voltage characteristics
Electric breakdown
Electric fields
Electron tunneling
Frequency modulation
Graphite
Helium neon lasers
Laser beam effects
Light polarization
Photons
Surface properties
Tungsten
Atomic resolution
Current rectification
Electron photon interaction
Highly oriented pyrolytic graphite
Laser induced signal
Photothermal current
Rectification signal
Tunneling current
Scanning tunneling microscopy
Acceso en línea:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_NIS18908_v9_n_p51_Bragas
http://hdl.handle.net/20.500.12110/paper_NIS18908_v9_n_p51_Bragas
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
Descripción
Sumario:Laser-assisted scanning tunneling microscopy (STM) has been used in recent years to obtain new information about surfaces properties in atomic scale. The authors have performed an experiment using a tungsten tip and highly oriented pyrolytic graphite (HOPG) as the sample. The tip-sample interface was illuminated with an He-Ne laser polarized in the s and p directions. To discriminate laser-induced signal from the background tunneling current, lock-in detection was used.

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