Assisted scanning tunneling microscopy with visible polarized laser light

Laser-assisted scanning tunneling microscopy (STM) has been used in recent years to obtain new information about surfaces properties in atomic scale. The authors have performed an experiment using a tungsten tip and highly oriented pyrolytic graphite (HOPG) as the sample. The tip-sample interface wa...

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Detalles Bibliográficos
Publicado:	1996
Materias:	Current voltage characteristics Electric breakdown Electric fields Electron tunneling Frequency modulation Graphite Helium neon lasers Laser beam effects Light polarization Photons Surface properties Tungsten Atomic resolution Current rectification Electron photon interaction Highly oriented pyrolytic graphite Laser induced signal Photothermal current Rectification signal Tunneling current Scanning tunneling microscopy
Acceso en línea:	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_NIS18908_v9_n_p51_Bragas http://hdl.handle.net/20.500.12110/paper_NIS18908_v9_n_p51_Bragas
Aporte de:	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

id	paper:paper_NIS18908_v9_n_p51_Bragas
record_format	dspace
spelling	paper:paper_NIS18908_v9_n_p51_Bragas2023-06-08T16:39:55Z Assisted scanning tunneling microscopy with visible polarized laser light Current voltage characteristics Electric breakdown Electric fields Electron tunneling Frequency modulation Graphite Helium neon lasers Laser beam effects Light polarization Photons Surface properties Tungsten Atomic resolution Current rectification Electron photon interaction Highly oriented pyrolytic graphite Laser induced signal Photothermal current Rectification signal Tunneling current Scanning tunneling microscopy Laser-assisted scanning tunneling microscopy (STM) has been used in recent years to obtain new information about surfaces properties in atomic scale. The authors have performed an experiment using a tungsten tip and highly oriented pyrolytic graphite (HOPG) as the sample. The tip-sample interface was illuminated with an He-Ne laser polarized in the s and p directions. To discriminate laser-induced signal from the background tunneling current, lock-in detection was used. 1996 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_NIS18908_v9_n_p51_Bragas http://hdl.handle.net/20.500.12110/paper_NIS18908_v9_n_p51_Bragas
institution	Universidad de Buenos Aires
institution_str	I-28
repository_str	R-134
collection	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic	Current voltage characteristics Electric breakdown Electric fields Electron tunneling Frequency modulation Graphite Helium neon lasers Laser beam effects Light polarization Photons Surface properties Tungsten Atomic resolution Current rectification Electron photon interaction Highly oriented pyrolytic graphite Laser induced signal Photothermal current Rectification signal Tunneling current Scanning tunneling microscopy
spellingShingle	Current voltage characteristics Electric breakdown Electric fields Electron tunneling Frequency modulation Graphite Helium neon lasers Laser beam effects Light polarization Photons Surface properties Tungsten Atomic resolution Current rectification Electron photon interaction Highly oriented pyrolytic graphite Laser induced signal Photothermal current Rectification signal Tunneling current Scanning tunneling microscopy Assisted scanning tunneling microscopy with visible polarized laser light
topic_facet	Current voltage characteristics Electric breakdown Electric fields Electron tunneling Frequency modulation Graphite Helium neon lasers Laser beam effects Light polarization Photons Surface properties Tungsten Atomic resolution Current rectification Electron photon interaction Highly oriented pyrolytic graphite Laser induced signal Photothermal current Rectification signal Tunneling current Scanning tunneling microscopy
description	Laser-assisted scanning tunneling microscopy (STM) has been used in recent years to obtain new information about surfaces properties in atomic scale. The authors have performed an experiment using a tungsten tip and highly oriented pyrolytic graphite (HOPG) as the sample. The tip-sample interface was illuminated with an He-Ne laser polarized in the s and p directions. To discriminate laser-induced signal from the background tunneling current, lock-in detection was used.
title	Assisted scanning tunneling microscopy with visible polarized laser light
title_short	Assisted scanning tunneling microscopy with visible polarized laser light
title_full	Assisted scanning tunneling microscopy with visible polarized laser light
title_fullStr	Assisted scanning tunneling microscopy with visible polarized laser light
title_full_unstemmed	Assisted scanning tunneling microscopy with visible polarized laser light
title_sort	assisted scanning tunneling microscopy with visible polarized laser light
publishDate	1996
url	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_NIS18908_v9_n_p51_Bragas http://hdl.handle.net/20.500.12110/paper_NIS18908_v9_n_p51_Bragas
_version_	1769175831067754496

Assisted scanning tunneling microscopy with visible polarized laser light

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