Reflection high-energy electron diffraction oscillations during epitaxial growth of artificially layered films of (BaCuOx)m/(CaCuO2)n
Pulsed laser deposition in molecular-beam epitaxy environment has been used to grow high quality BaCuOx/CaCuO2 superlattices. In situ reflection high energy electron diffraction (RHEED) shows that the growth mechanism is two-dimensional. Furthermore, weak but reproducible RHEED intensity oscillation...
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2001
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Acceso en línea: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_09214534_v355_n3-4_p335_Tebano http://hdl.handle.net/20.500.12110/paper_09214534_v355_n3-4_p335_Tebano |
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Sumario: | Pulsed laser deposition in molecular-beam epitaxy environment has been used to grow high quality BaCuOx/CaCuO2 superlattices. In situ reflection high energy electron diffraction (RHEED) shows that the growth mechanism is two-dimensional. Furthermore, weak but reproducible RHEED intensity oscillations have been monitored during the growth. Ex situ X-ray diffraction spectra confirmed the growth rate deduced from RHEED oscillations. Such results demonstrate that RHEED oscillations can be used, even for (BaCuOx)2/(CaCuO2)2 superlattices, for phase locking of the growth. © 2001 Elsevier Science B.V. |
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