Avoiding photothermal noise in laser assisted scanning tunneling microscopy

Thermal expansion produced by laser irradiation of the tunneling junction is analyzed, as a necessary step towards detection and identification of other laser induced currents in scanning tunneling microscopy (STM). Solving a tridimensional heat diffusion model, the amplitude of thermal expansion as...

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Autores principales: Landi, Sandra Marcela, Bragas, Andrea Verónica, Martínez, Oscar Eduardo
Publicado: 1999
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Acceso en línea:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_03043991_v77_n3-4_p207_Landi
http://hdl.handle.net/20.500.12110/paper_03043991_v77_n3-4_p207_Landi
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spelling paper:paper_03043991_v77_n3-4_p207_Landi2023-06-08T15:29:41Z Avoiding photothermal noise in laser assisted scanning tunneling microscopy Landi, Sandra Marcela Bragas, Andrea Verónica Martínez, Oscar Eduardo Laser assisted Photothermal currents Scanning tunneling microscope Thermal noise Computational methods Electric currents Gold Graphite Laser beam effects Mathematical models Signal to noise ratio Thermal diffusion Thermal expansion Gaussian beams Photothermal noise Scanning tunneling microscopy analytic method article frequency modulation heat transfer laser mathematical analysis scanning tunneling microscopy signal noise ratio thermal exposure Thermal expansion produced by laser irradiation of the tunneling junction is analyzed, as a necessary step towards detection and identification of other laser induced currents in scanning tunneling microscopy (STM). Solving a tridimensional heat diffusion model, the amplitude of thermal expansion as a function of the modulation frequency (ω) of the light power, rolls off as 1/ω while the in-phase component rolls off as 1/ω2, both computed at the Gaussian beam center. But shifted from the center a dephasing mechanism appears due to the lateral diffusion of the heat, and the in-phase thermal contribution drops to zero. This behavior can be used to increase the signal to noise ratio without the need of driving the experiment at high frequencies, frequently over the usual cutoff frequency of STM amplifiers. Experiments were carried on using a low power laser on highly oriented pyrolitic graphite (HOPG) and gold samples, showing a qualitative agreement with the model. Thermal expansion produced by laser irradiation of the tunneling junction is analyzed, as a necessary step towards detection and identification of other laser induced currents in scanning tunneling microscopy (STM). Solving a tridimensional heat diffusion model, the amplitude of thermal expansion as a function of the modulation frequency (ω) of the light power, rolls off as 1/ω while the in-phase component rolls off as 1/ω+2$/, both computed at the Gaussian beam center. But shifted from the center a dephasing mechanism appears due to the lateral diffusion of the heat, and the in-phase thermal contribution drops to zero. This behavior can be used to increase the signal to noise ratio without the need of driving the experiment at high frequencies, frequently over the usual cutoff frequency of STM amplifiers. Experiments were carried on using a low power laser on highly oriented pyrolitic graphite (HOPG) and gold samples, showing a qualitative agreement with the model. Fil:Landi, S.M. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Bragas, A.V. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Martínez, O.E. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. 1999 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_03043991_v77_n3-4_p207_Landi http://hdl.handle.net/20.500.12110/paper_03043991_v77_n3-4_p207_Landi
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Laser assisted
Photothermal currents
Scanning tunneling microscope
Thermal noise
Computational methods
Electric currents
Gold
Graphite
Laser beam effects
Mathematical models
Signal to noise ratio
Thermal diffusion
Thermal expansion
Gaussian beams
Photothermal noise
Scanning tunneling microscopy
analytic method
article
frequency modulation
heat transfer
laser
mathematical analysis
scanning tunneling microscopy
signal noise ratio
thermal exposure
spellingShingle Laser assisted
Photothermal currents
Scanning tunneling microscope
Thermal noise
Computational methods
Electric currents
Gold
Graphite
Laser beam effects
Mathematical models
Signal to noise ratio
Thermal diffusion
Thermal expansion
Gaussian beams
Photothermal noise
Scanning tunneling microscopy
analytic method
article
frequency modulation
heat transfer
laser
mathematical analysis
scanning tunneling microscopy
signal noise ratio
thermal exposure
Landi, Sandra Marcela
Bragas, Andrea Verónica
Martínez, Oscar Eduardo
Avoiding photothermal noise in laser assisted scanning tunneling microscopy
topic_facet Laser assisted
Photothermal currents
Scanning tunneling microscope
Thermal noise
Computational methods
Electric currents
Gold
Graphite
Laser beam effects
Mathematical models
Signal to noise ratio
Thermal diffusion
Thermal expansion
Gaussian beams
Photothermal noise
Scanning tunneling microscopy
analytic method
article
frequency modulation
heat transfer
laser
mathematical analysis
scanning tunneling microscopy
signal noise ratio
thermal exposure
description Thermal expansion produced by laser irradiation of the tunneling junction is analyzed, as a necessary step towards detection and identification of other laser induced currents in scanning tunneling microscopy (STM). Solving a tridimensional heat diffusion model, the amplitude of thermal expansion as a function of the modulation frequency (ω) of the light power, rolls off as 1/ω while the in-phase component rolls off as 1/ω2, both computed at the Gaussian beam center. But shifted from the center a dephasing mechanism appears due to the lateral diffusion of the heat, and the in-phase thermal contribution drops to zero. This behavior can be used to increase the signal to noise ratio without the need of driving the experiment at high frequencies, frequently over the usual cutoff frequency of STM amplifiers. Experiments were carried on using a low power laser on highly oriented pyrolitic graphite (HOPG) and gold samples, showing a qualitative agreement with the model. Thermal expansion produced by laser irradiation of the tunneling junction is analyzed, as a necessary step towards detection and identification of other laser induced currents in scanning tunneling microscopy (STM). Solving a tridimensional heat diffusion model, the amplitude of thermal expansion as a function of the modulation frequency (ω) of the light power, rolls off as 1/ω while the in-phase component rolls off as 1/ω+2$/, both computed at the Gaussian beam center. But shifted from the center a dephasing mechanism appears due to the lateral diffusion of the heat, and the in-phase thermal contribution drops to zero. This behavior can be used to increase the signal to noise ratio without the need of driving the experiment at high frequencies, frequently over the usual cutoff frequency of STM amplifiers. Experiments were carried on using a low power laser on highly oriented pyrolitic graphite (HOPG) and gold samples, showing a qualitative agreement with the model.
author Landi, Sandra Marcela
Bragas, Andrea Verónica
Martínez, Oscar Eduardo
author_facet Landi, Sandra Marcela
Bragas, Andrea Verónica
Martínez, Oscar Eduardo
author_sort Landi, Sandra Marcela
title Avoiding photothermal noise in laser assisted scanning tunneling microscopy
title_short Avoiding photothermal noise in laser assisted scanning tunneling microscopy
title_full Avoiding photothermal noise in laser assisted scanning tunneling microscopy
title_fullStr Avoiding photothermal noise in laser assisted scanning tunneling microscopy
title_full_unstemmed Avoiding photothermal noise in laser assisted scanning tunneling microscopy
title_sort avoiding photothermal noise in laser assisted scanning tunneling microscopy
publishDate 1999
url https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_03043991_v77_n3-4_p207_Landi
http://hdl.handle.net/20.500.12110/paper_03043991_v77_n3-4_p207_Landi
work_keys_str_mv AT landisandramarcela avoidingphotothermalnoiseinlaserassistedscanningtunnelingmicroscopy
AT bragasandreaveronica avoidingphotothermalnoiseinlaserassistedscanningtunnelingmicroscopy
AT martinezoscareduardo avoidingphotothermalnoiseinlaserassistedscanningtunnelingmicroscopy
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