Nonlinear optical nanoscope with depth resolution

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Existing optical scanning microscopes don't allow the determination of the depth below the surface of the sample under which where scatterers might be located, due to the simple exponential decay of their evanescent probing field. We propose a nonlinear near field microscope which would allow t...

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Detalles Bibliográficos
Autor principal: Brudny, Vera Leonor
Publicado: 2004
Materias:
Nanoscope
Near field optical microscope
Surface optical second harmonic generation
Imaging techniques
Light propagation
Near field scanning optical microscopy
Optical fibers
Optical resolving power
Optical waveguides
Scanning tunneling microscopy
Second harmonic generation
Sensitivity analysis
Thin films
Three dimensional computer graphics
Nonlinear optical nanoscopes
Scanning near-field optical microscopes (SNOM)
Second harmonic (SH)
Surface optical second harmonic generations
Nonlinear optics
Acceso en línea:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0277786X_v5622_nPART1_p524_Mochan
http://hdl.handle.net/20.500.12110/paper_0277786X_v5622_nPART1_p524_Mochan
Aporte de:
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires
id paper:paper_0277786X_v5622_nPART1_p524_Mochan
record_format dspace
spelling paper:paper_0277786X_v5622_nPART1_p524_Mochan2023-06-08T15:26:21Z Nonlinear optical nanoscope with depth resolution Brudny, Vera Leonor Nanoscope Near field optical microscope Surface optical second harmonic generation Imaging techniques Light propagation Near field scanning optical microscopy Optical fibers Optical resolving power Optical waveguides Scanning tunneling microscopy Second harmonic generation Sensitivity analysis Thin films Three dimensional computer graphics Nonlinear optical nanoscopes Scanning near-field optical microscopes (SNOM) Second harmonic (SH) Surface optical second harmonic generations Nonlinear optics Existing optical scanning microscopes don't allow the determination of the depth below the surface of the sample under which where scatterers might be located, due to the simple exponential decay of their evanescent probing field. We propose a nonlinear near field microscope which would allow three dimensional images of buried structrures with nanometric resolution along all dimensions. Fil:Brudny, V.L. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. 2004 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0277786X_v5622_nPART1_p524_Mochan http://hdl.handle.net/20.500.12110/paper_0277786X_v5622_nPART1_p524_Mochan
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-134
collection Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic Nanoscope
Near field optical microscope
Surface optical second harmonic generation
Imaging techniques
Light propagation
Near field scanning optical microscopy
Optical fibers
Optical resolving power
Optical waveguides
Scanning tunneling microscopy
Second harmonic generation
Sensitivity analysis
Thin films
Three dimensional computer graphics
Nonlinear optical nanoscopes
Scanning near-field optical microscopes (SNOM)
Second harmonic (SH)
Surface optical second harmonic generations
Nonlinear optics
spellingShingle Nanoscope
Near field optical microscope
Surface optical second harmonic generation
Imaging techniques
Light propagation
Near field scanning optical microscopy
Optical fibers
Optical resolving power
Optical waveguides
Scanning tunneling microscopy
Second harmonic generation
Sensitivity analysis
Thin films
Three dimensional computer graphics
Nonlinear optical nanoscopes
Scanning near-field optical microscopes (SNOM)
Second harmonic (SH)
Surface optical second harmonic generations
Nonlinear optics
Brudny, Vera Leonor
Nonlinear optical nanoscope with depth resolution
topic_facet Nanoscope
Near field optical microscope
Surface optical second harmonic generation
Imaging techniques
Light propagation
Near field scanning optical microscopy
Optical fibers
Optical resolving power
Optical waveguides
Scanning tunneling microscopy
Second harmonic generation
Sensitivity analysis
Thin films
Three dimensional computer graphics
Nonlinear optical nanoscopes
Scanning near-field optical microscopes (SNOM)
Second harmonic (SH)
Surface optical second harmonic generations
Nonlinear optics
description Existing optical scanning microscopes don't allow the determination of the depth below the surface of the sample under which where scatterers might be located, due to the simple exponential decay of their evanescent probing field. We propose a nonlinear near field microscope which would allow three dimensional images of buried structrures with nanometric resolution along all dimensions.
author Brudny, Vera Leonor
author_facet Brudny, Vera Leonor
author_sort Brudny, Vera Leonor
title Nonlinear optical nanoscope with depth resolution
title_short Nonlinear optical nanoscope with depth resolution
title_full Nonlinear optical nanoscope with depth resolution
title_fullStr Nonlinear optical nanoscope with depth resolution
title_full_unstemmed Nonlinear optical nanoscope with depth resolution
title_sort nonlinear optical nanoscope with depth resolution
publishDate 2004
url https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0277786X_v5622_nPART1_p524_Mochan
http://hdl.handle.net/20.500.12110/paper_0277786X_v5622_nPART1_p524_Mochan
work_keys_str_mv AT brudnyveraleonor nonlinearopticalnanoscopewithdepthresolution
_version_ 1768542551187390464

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