Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K

This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10...

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Publicado:	2013
Materias:	Broadband dielectric spectroscopy Clamped piezoelectric Medical imaging Piezoelectric thin films Poly(vinylidene fluoride) PVDF Ultrasonic transducers Arrhenius dependence Broad-band dielectric spectroscopy Dielectric characterization Dielectric relaxation spectra Poly (vinylidene fluoride)(PVDF) Poly(vinylidene fluoride) Characterization Dielectric relaxation Thin films Transducers Piezoelectricity
Acceso en línea:	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_01429418_v32_n7_p1186_CiocciBrazzano http://hdl.handle.net/20.500.12110/paper_01429418_v32_n7_p1186_CiocciBrazzano
Aporte de:	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

id	paper:paper_01429418_v32_n7_p1186_CiocciBrazzano
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spelling	paper:paper_01429418_v32_n7_p1186_CiocciBrazzano2023-06-08T15:11:41Z Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K Broadband dielectric spectroscopy Clamped piezoelectric Medical imaging Piezoelectric thin films Poly(vinylidene fluoride) PVDF Ultrasonic transducers Arrhenius dependence Broad-band dielectric spectroscopy Clamped piezoelectric Dielectric characterization Dielectric relaxation spectra Piezoelectric thin films Poly (vinylidene fluoride)(PVDF) Poly(vinylidene fluoride) Characterization Dielectric relaxation Medical imaging Thin films Transducers Ultrasonic transducers Piezoelectricity This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers. © 2013 Elsevier Ltd. All rights reserved. 2013 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_01429418_v32_n7_p1186_CiocciBrazzano http://hdl.handle.net/20.500.12110/paper_01429418_v32_n7_p1186_CiocciBrazzano
institution	Universidad de Buenos Aires
institution_str	I-28
repository_str	R-134
collection	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic	Broadband dielectric spectroscopy Clamped piezoelectric Medical imaging Piezoelectric thin films Poly(vinylidene fluoride) PVDF Ultrasonic transducers Arrhenius dependence Broad-band dielectric spectroscopy Clamped piezoelectric Dielectric characterization Dielectric relaxation spectra Piezoelectric thin films Poly (vinylidene fluoride)(PVDF) Poly(vinylidene fluoride) Characterization Dielectric relaxation Medical imaging Thin films Transducers Ultrasonic transducers Piezoelectricity
spellingShingle	Broadband dielectric spectroscopy Clamped piezoelectric Medical imaging Piezoelectric thin films Poly(vinylidene fluoride) PVDF Ultrasonic transducers Arrhenius dependence Broad-band dielectric spectroscopy Clamped piezoelectric Dielectric characterization Dielectric relaxation spectra Piezoelectric thin films Poly (vinylidene fluoride)(PVDF) Poly(vinylidene fluoride) Characterization Dielectric relaxation Medical imaging Thin films Transducers Ultrasonic transducers Piezoelectricity Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
topic_facet	Broadband dielectric spectroscopy Clamped piezoelectric Medical imaging Piezoelectric thin films Poly(vinylidene fluoride) PVDF Ultrasonic transducers Arrhenius dependence Broad-band dielectric spectroscopy Clamped piezoelectric Dielectric characterization Dielectric relaxation spectra Piezoelectric thin films Poly (vinylidene fluoride)(PVDF) Poly(vinylidene fluoride) Characterization Dielectric relaxation Medical imaging Thin films Transducers Ultrasonic transducers Piezoelectricity
description	This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers. © 2013 Elsevier Ltd. All rights reserved.
title	Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
title_short	Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
title_full	Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
title_fullStr	Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
title_full_unstemmed	Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
title_sort	broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 k and 308 k
publishDate	2013
url	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_01429418_v32_n7_p1186_CiocciBrazzano http://hdl.handle.net/20.500.12110/paper_01429418_v32_n7_p1186_CiocciBrazzano
_version_	1768544546078064640

Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K

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