On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results

The first study of Langmuir probes applied to cutting arcs using a sweeping-probe system is presented. It is found that, under a relatively broad range of experimental conditions (changes in the probe material, in the probe radii, or in the sweeping frequency of the probes), no probe damage is regis...

Descripción completa

Guardado en:

Detalles Bibliográficos
Autor principal:	Kelly, Héctor Juan
Publicado:	2008
Materias:	Cutting arcs Langmuir probes Plasma diagnostic Electric currents Electron emission Plasma diagnostics Sweeping-probe system Plasma arc cutting
Acceso en línea:	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00933813_v36PART2_n1_p263_Prevosto http://hdl.handle.net/20.500.12110/paper_00933813_v36PART2_n1_p263_Prevosto
Aporte de:	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

id	paper:paper_00933813_v36PART2_n1_p263_Prevosto
record_format	dspace
spelling	paper:paper_00933813_v36PART2_n1_p263_Prevosto2023-06-08T15:08:40Z On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results Kelly, Héctor Juan Cutting arcs Langmuir probes Plasma diagnostic Electric currents Electron emission Langmuir probes Plasma diagnostics Cutting arcs Sweeping-probe system Plasma arc cutting The first study of Langmuir probes applied to cutting arcs using a sweeping-probe system is presented. It is found that, under a relatively broad range of experimental conditions (changes in the probe material, in the probe radii, or in the sweeping frequency of the probes), no probe damage is registered, notwithstanding the large value of the power flux present with these arcs. In practice, probes with radii down to 63 μm and with sweeping rotation frequencies down to 8.7 s -1 (probe transit time of ≈140 μs through the arc) were used without noticeable alterations. In the measurements of the ion current collected by negatively biased probes, the following two unexpected features are found: the lack of a current plateau in the ion branch of the I-V probe characteristic and the independence of the signal amplitude on the probe radius. According to the experimental evidence, as well as several estimations, we have neglected electron emission of the probe surface as a relevant mechanism in modifying the ion branch of the characteristic. On the contrary, some arguments on which a collection model will be based are presented. © 2008 IEEE. Fil:Kelly, H. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. 2008 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00933813_v36PART2_n1_p263_Prevosto http://hdl.handle.net/20.500.12110/paper_00933813_v36PART2_n1_p263_Prevosto
institution	Universidad de Buenos Aires
institution_str	I-28
repository_str	R-134
collection	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic	Cutting arcs Langmuir probes Plasma diagnostic Electric currents Electron emission Langmuir probes Plasma diagnostics Cutting arcs Sweeping-probe system Plasma arc cutting
spellingShingle	Cutting arcs Langmuir probes Plasma diagnostic Electric currents Electron emission Langmuir probes Plasma diagnostics Cutting arcs Sweeping-probe system Plasma arc cutting Kelly, Héctor Juan On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
topic_facet	Cutting arcs Langmuir probes Plasma diagnostic Electric currents Electron emission Langmuir probes Plasma diagnostics Cutting arcs Sweeping-probe system Plasma arc cutting
description	The first study of Langmuir probes applied to cutting arcs using a sweeping-probe system is presented. It is found that, under a relatively broad range of experimental conditions (changes in the probe material, in the probe radii, or in the sweeping frequency of the probes), no probe damage is registered, notwithstanding the large value of the power flux present with these arcs. In practice, probes with radii down to 63 μm and with sweeping rotation frequencies down to 8.7 s -1 (probe transit time of ≈140 μs through the arc) were used without noticeable alterations. In the measurements of the ion current collected by negatively biased probes, the following two unexpected features are found: the lack of a current plateau in the ion branch of the I-V probe characteristic and the independence of the signal amplitude on the probe radius. According to the experimental evidence, as well as several estimations, we have neglected electron emission of the probe surface as a relevant mechanism in modifying the ion branch of the characteristic. On the contrary, some arguments on which a collection model will be based are presented. © 2008 IEEE.
author	Kelly, Héctor Juan
author_facet	Kelly, Héctor Juan
author_sort	Kelly, Héctor Juan
title	On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
title_short	On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
title_full	On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
title_fullStr	On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
title_full_unstemmed	On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results
title_sort	on the use of sweeping langmuir probes in cutting arc plasmas - part i: experimental results
publishDate	2008
url	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00933813_v36PART2_n1_p263_Prevosto http://hdl.handle.net/20.500.12110/paper_00933813_v36PART2_n1_p263_Prevosto
work_keys_str_mv	AT kellyhectorjuan ontheuseofsweepinglangmuirprobesincuttingarcplasmaspartiexperimentalresults
_version_	1768544772278976512

On the use of sweeping Langmuir probes in cutting arc plasmas - Part I: Experimental results

Ejemplares similares