Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy

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Field-enhanced scanning optical microscopy relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near-field information recorded in a field-enhanced scanning optical microscopy ex...

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Autores principales:	Scarpettini, Alberto F., Bragas, Andrea Verónica
Publicado:	2015
Materias:	Enhancement factor Harmonic demodulation Scanning near-field optical microscopy Article field enhanced near field optical microscopy frequency modulation laser mathematical analysis mathematical computing mathematical model prediction Raman spectrometry scanning electron microscopy signal detection signal processing
Acceso en línea:	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00222720_v257_n1_p54_Scarpettini http://hdl.handle.net/20.500.12110/paper_00222720_v257_n1_p54_Scarpettini
Aporte de:	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) de Universidad de Buenos Aires

id	paper:paper_00222720_v257_n1_p54_Scarpettini
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spelling	paper:paper_00222720_v257_n1_p54_Scarpettini2023-06-08T14:48:42Z Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy Scarpettini, Alberto F. Bragas, Andrea Verónica Enhancement factor Harmonic demodulation Scanning near-field optical microscopy Article field enhanced near field optical microscopy frequency modulation laser mathematical analysis mathematical computing mathematical model prediction Raman spectrometry scanning electron microscopy signal detection signal processing Field-enhanced scanning optical microscopy relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near-field information recorded in a field-enhanced scanning optical microscopy experiment, has to surpass the background light, always present due to multiple interferences between the macroscopic probe and sample. In this work, we show that when the probe-sample distance is modulated with very low amplitude, the higher the harmonic demodulation is, the better the ratio between the near-field signal and the interferometric background results. The choice of working at a given n harmonic is dictated by the experiment when the signal at the n + 1 harmonic goes below the experimental noise. We demonstrate that the optical contrast comes from the nth derivative of the near-field scattering, amplified by the interferometric background. By modelling the far and near field we calculate the probe-sample approach curves, which fit very well the experimental ones. After taking a great amount of experimental data for different probes and samples, we conclude with a table of the minimum enhancement factors needed to have optical contrast with field-enhanced scanning optical microscopy. © 2014 Royal Microscopical Society. Fil:Scarpettini, A.F. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. Fil:Bragas, A.V. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. 2015 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00222720_v257_n1_p54_Scarpettini http://hdl.handle.net/20.500.12110/paper_00222720_v257_n1_p54_Scarpettini
institution	Universidad de Buenos Aires
institution_str	I-28
repository_str	R-134
collection	Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA)
topic	Enhancement factor Harmonic demodulation Scanning near-field optical microscopy Article field enhanced near field optical microscopy frequency modulation laser mathematical analysis mathematical computing mathematical model prediction Raman spectrometry scanning electron microscopy signal detection signal processing
spellingShingle	Enhancement factor Harmonic demodulation Scanning near-field optical microscopy Article field enhanced near field optical microscopy frequency modulation laser mathematical analysis mathematical computing mathematical model prediction Raman spectrometry scanning electron microscopy signal detection signal processing Scarpettini, Alberto F. Bragas, Andrea Verónica Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
topic_facet	Enhancement factor Harmonic demodulation Scanning near-field optical microscopy Article field enhanced near field optical microscopy frequency modulation laser mathematical analysis mathematical computing mathematical model prediction Raman spectrometry scanning electron microscopy signal detection signal processing
description	Field-enhanced scanning optical microscopy relies on the design and fabrication of plasmonic probes which had to provide optical and chemical contrast at the nanoscale. In order to do so, the scattering containing the near-field information recorded in a field-enhanced scanning optical microscopy experiment, has to surpass the background light, always present due to multiple interferences between the macroscopic probe and sample. In this work, we show that when the probe-sample distance is modulated with very low amplitude, the higher the harmonic demodulation is, the better the ratio between the near-field signal and the interferometric background results. The choice of working at a given n harmonic is dictated by the experiment when the signal at the n + 1 harmonic goes below the experimental noise. We demonstrate that the optical contrast comes from the nth derivative of the near-field scattering, amplified by the interferometric background. By modelling the far and near field we calculate the probe-sample approach curves, which fit very well the experimental ones. After taking a great amount of experimental data for different probes and samples, we conclude with a table of the minimum enhancement factors needed to have optical contrast with field-enhanced scanning optical microscopy. © 2014 Royal Microscopical Society.
author	Scarpettini, Alberto F. Bragas, Andrea Verónica
author_facet	Scarpettini, Alberto F. Bragas, Andrea Verónica
author_sort	Scarpettini, Alberto F.
title	Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_short	Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_full	Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_fullStr	Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_full_unstemmed	Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
title_sort	harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy
publishDate	2015
url	https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00222720_v257_n1_p54_Scarpettini http://hdl.handle.net/20.500.12110/paper_00222720_v257_n1_p54_Scarpettini
work_keys_str_mv	AT scarpettinialbertof harmonicdemodulationandminimumenhancementfactorsinfieldenhancednearfieldopticalmicroscopy AT bragasandreaveronica harmonicdemodulationandminimumenhancementfactorsinfieldenhancednearfieldopticalmicroscopy
_version_	1768543787760484352

Harmonic demodulation and minimum enhancement factors in field-enhanced near-field optical microscopy

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