Cyclic electric field stress on bipolar resistive switching devices
We have studied the effects of accumulating cyclic electrical pulses of increasing amplitude on the non-volatile resistance state of interfaces made by sputtering a metal (Au, Pt) on top of the surface of a cuprate superconductor YBa2Cu3O7-δ. We have analyzed the influence of the number of applied p...
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2013
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| Acceso en línea: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00218979_v114_n24_p_Schulman http://hdl.handle.net/20.500.12110/paper_00218979_v114_n24_p_Schulman |
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paper:paper_00218979_v114_n24_p_Schulman2025-07-30T17:25:12Z Cyclic electric field stress on bipolar resistive switching devices Acha, Carlos Enrique Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses We have studied the effects of accumulating cyclic electrical pulses of increasing amplitude on the non-volatile resistance state of interfaces made by sputtering a metal (Au, Pt) on top of the surface of a cuprate superconductor YBa2Cu3O7-δ. We have analyzed the influence of the number of applied pulses N on the relative amplitude of the remnant resistance change between the high (RH) and the low (R L) state [( = (R H-R L) / R L] at different temperatures (T). We show that the critical voltage (Vc) needed to produce a resistive switching (RS, i.e., > 0) decreases with increasing N or T. We also find a power law relation between the voltage of the pulses and the number of pulses N 0 required to produce a RS of = 0. This relation remains very similar to the Basquin equation used to describe the stress-fatigue lifetime curves in mechanical tests. This points out to the similarity between the physics of the RS, associated with the diffusion of oxygen vacancies induced by electrical pulses, and the propagation of defects in materials subjected to repeated mechanical stress. © 2013 AIP Publishing LLC. Fil:Acha, C. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales; Argentina. 2013 https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00218979_v114_n24_p_Schulman http://hdl.handle.net/20.500.12110/paper_00218979_v114_n24_p_Schulman |
| institution |
Universidad de Buenos Aires |
| institution_str |
I-28 |
| repository_str |
R-134 |
| collection |
Biblioteca Digital - Facultad de Ciencias Exactas y Naturales (UBA) |
| topic |
Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses |
| spellingShingle |
Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses Acha, Carlos Enrique Cyclic electric field stress on bipolar resistive switching devices |
| topic_facet |
Critical voltages Diffusion of oxygens Electric field stress Power law relation Relative amplitude Resistance change Resistive switching Resistive switching devices Electric fields High temperature superconductors Interface states Switching systems Stresses |
| description |
We have studied the effects of accumulating cyclic electrical pulses of increasing amplitude on the non-volatile resistance state of interfaces made by sputtering a metal (Au, Pt) on top of the surface of a cuprate superconductor YBa2Cu3O7-δ. We have analyzed the influence of the number of applied pulses N on the relative amplitude of the remnant resistance change between the high (RH) and the low (R L) state [( = (R H-R L) / R L] at different temperatures (T). We show that the critical voltage (Vc) needed to produce a resistive switching (RS, i.e., > 0) decreases with increasing N or T. We also find a power law relation between the voltage of the pulses and the number of pulses N 0 required to produce a RS of = 0. This relation remains very similar to the Basquin equation used to describe the stress-fatigue lifetime curves in mechanical tests. This points out to the similarity between the physics of the RS, associated with the diffusion of oxygen vacancies induced by electrical pulses, and the propagation of defects in materials subjected to repeated mechanical stress. © 2013 AIP Publishing LLC. |
| author |
Acha, Carlos Enrique |
| author_facet |
Acha, Carlos Enrique |
| author_sort |
Acha, Carlos Enrique |
| title |
Cyclic electric field stress on bipolar resistive switching devices |
| title_short |
Cyclic electric field stress on bipolar resistive switching devices |
| title_full |
Cyclic electric field stress on bipolar resistive switching devices |
| title_fullStr |
Cyclic electric field stress on bipolar resistive switching devices |
| title_full_unstemmed |
Cyclic electric field stress on bipolar resistive switching devices |
| title_sort |
cyclic electric field stress on bipolar resistive switching devices |
| publishDate |
2013 |
| url |
https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00218979_v114_n24_p_Schulman http://hdl.handle.net/20.500.12110/paper_00218979_v114_n24_p_Schulman |
| work_keys_str_mv |
AT achacarlosenrique cyclicelectricfieldstressonbipolarresistiveswitchingdevices |
| _version_ |
1840320876422103040 |