Wide band interferometryforthicknessmeasurement

In thisworkwepresentthe concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurementmethodthatgainsprecisionwhenthebandwidthisreduced to anadequatecompromise in order to avoidthedistortionsarisingfromthe material dispersion. The use of thewide...

Descripción completa

Detalles Bibliográficos
Autores principales: Constantino, Santiago, Martínez, Oscar, Torga, Jorge
Formato: Artículo publishedVersion
Lenguaje:Inglés
Publicado: 2020
Materias:
UTN
FRD
Wide Band Interferometry
White-light Interferometry
Thicknessmeasurement
Acceso en línea:http://hdl.handle.net/20.500.12272/4474
Aporte de:
RIA - Repositorio Institucional Abierto (UTN) de Universidad Tecnológica Nacional
id I68-R174-20.500.12272-4474
record_format dspace
institution Universidad Tecnológica Nacional
institution_str I-68
repository_str R-174
collection RIA - Repositorio Institucional Abierto (UTN)
language Inglés
topic UTN
FRD
Wide Band Interferometry
White-light Interferometry
Thicknessmeasurement
spellingShingle UTN
FRD
Wide Band Interferometry
White-light Interferometry
Thicknessmeasurement
Constantino, Santiago
Martínez, Oscar
Torga, Jorge
Wide band interferometryforthicknessmeasurement
topic_facet UTN
FRD
Wide Band Interferometry
White-light Interferometry
Thicknessmeasurement
description In thisworkwepresentthe concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurementmethodthatgainsprecisionwhenthebandwidthisreduced to anadequatecompromise in order to avoidthedistortionsarisingfromthe material dispersion. The use of thewidestpossible band is a well established dogma whenthehighestresolutionisdesired in distance measurementswithwhite-light interferometry. Wewill show thatthe dogma fallswhenthicknessmeasurementsmust be carriedoutdue to material dispersion. In factthe precise knowledge of thefrequencydependence of therefractiveindexisessentialforadequatethicknessretrievalfromthe opticalexperiments. Thedevicewepresentisalsouseful to obtainthegroup refractiveindexthatisnecessary to calculatetheabsolutethicknessvalue. As anexample, we show thespreading of a siliconeoilon a reference surface in real time.
format Artículo
publishedVersion
author Constantino, Santiago
Martínez, Oscar
Torga, Jorge
author_facet Constantino, Santiago
Martínez, Oscar
Torga, Jorge
author_sort Constantino, Santiago
title Wide band interferometryforthicknessmeasurement
title_short Wide band interferometryforthicknessmeasurement
title_full Wide band interferometryforthicknessmeasurement
title_fullStr Wide band interferometryforthicknessmeasurement
title_full_unstemmed Wide band interferometryforthicknessmeasurement
title_sort wide band interferometryforthicknessmeasurement
publishDate 2020
url http://hdl.handle.net/20.500.12272/4474
work_keys_str_mv AT constantinosantiago widebandinterferometryforthicknessmeasurement
AT martinezoscar widebandinterferometryforthicknessmeasurement
AT torgajorge widebandinterferometryforthicknessmeasurement
bdutipo_str Repositorios
_version_ 1764820551851835397

Ejemplares similares