Transparent glass slab thickness measurement by binary-spot focus signal
Focus error systems based on the astigmatic principle relying on four quadrant photo detectors as the signal generation element have widely been used in many different applications. Nevertheless, its working principle is not particularly suitable for measurements involving more than one spot. In t...
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| Autores principales: | , |
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| Formato: | Artículo publishedVersion |
| Lenguaje: | Inglés |
| Publicado: |
2020
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| Materias: | |
| Acceso en línea: | http://hdl.handle.net/20.500.12272/4473 |
| Aporte de: |
| id |
I68-R174-20.500.12272-4473 |
|---|---|
| record_format |
dspace |
| institution |
Universidad Tecnológica Nacional |
| institution_str |
I-68 |
| repository_str |
R-174 |
| collection |
RIA - Repositorio Institucional Abierto (UTN) |
| language |
Inglés |
| topic |
UTN FRD Focus-Error-Signal Astigmatic Thickness Beam profilometer Multiple spots |
| spellingShingle |
UTN FRD Focus-Error-Signal Astigmatic Thickness Beam profilometer Multiple spots Aguilar, Andrés Torga, Jorge Transparent glass slab thickness measurement by binary-spot focus signal |
| topic_facet |
UTN FRD Focus-Error-Signal Astigmatic Thickness Beam profilometer Multiple spots |
| description |
Focus error systems based on the astigmatic principle relying on four quadrant photo detectors as
the signal generation element have widely been used in many different applications. Nevertheless, its
working principle is not particularly suitable for measurements involving more than one spot. In this
work we propose a new method that uses a CCD as the detection device as well as a method of
processing acquired data. A side effect of this change is the loss of the FES parameter key to these
techniques. To overcome this issue a new parameter named focus signal is proposed. The thickness
measuring process of a transparent sample with two reflective layers using this technique is also
presented. |
| format |
Artículo publishedVersion |
| author |
Aguilar, Andrés Torga, Jorge |
| author_facet |
Aguilar, Andrés Torga, Jorge |
| author_sort |
Aguilar, Andrés |
| title |
Transparent glass slab thickness measurement by binary-spot focus signal |
| title_short |
Transparent glass slab thickness measurement by binary-spot focus signal |
| title_full |
Transparent glass slab thickness measurement by binary-spot focus signal |
| title_fullStr |
Transparent glass slab thickness measurement by binary-spot focus signal |
| title_full_unstemmed |
Transparent glass slab thickness measurement by binary-spot focus signal |
| title_sort |
transparent glass slab thickness measurement by binary-spot focus signal |
| publishDate |
2020 |
| url |
http://hdl.handle.net/20.500.12272/4473 |
| work_keys_str_mv |
AT aguilarandres transparentglassslabthicknessmeasurementbybinaryspotfocussignal AT torgajorge transparentglassslabthicknessmeasurementbybinaryspotfocussignal |
| bdutipo_str |
Repositorios |
| _version_ |
1764820551851835393 |