Dimensional characterization of large opaque samples and microdeformations by low coherence interferometry

We report on the application of an interferometric system based on the low-coherence interferometry technique to the dimensional characterization of large opaque mechanical parts as well as microdeformations experienced by them. The implemented scheme is capable of simultaneously measuring very smal...

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Detalles Bibliográficos
Autores principales: Torga, Jorge, Morel, Eneas, Russo, Nélida A., Duchowicz, Ricardo
Formato: Artículo publishedVersion
Lenguaje:Inglés
Publicado: 2020
Materias:
UTN FRD
low-coherence interferometry
microdeformations
fourier chirp algoritmo
Acceso en línea:http://hdl.handle.net/20.500.12272/4283
Aporte de:
RIA - Repositorio Institucional Abierto (UTN) de Universidad Tecnológica Nacional
id I68-R174-20.500.12272-4283
record_format dspace
institution Universidad Tecnológica Nacional
institution_str I-68
repository_str R-174
collection RIA - Repositorio Institucional Abierto (UTN)
language Inglés
topic UTN FRD
low-coherence interferometry
microdeformations
fourier chirp algoritmo
spellingShingle UTN FRD
low-coherence interferometry
microdeformations
fourier chirp algoritmo
Torga, Jorge
Morel, Eneas
Russo, Nélida A.
Duchowicz, Ricardo
Dimensional characterization of large opaque samples and microdeformations by low coherence interferometry
topic_facet UTN FRD
low-coherence interferometry
microdeformations
fourier chirp algoritmo
description We report on the application of an interferometric system based on the low-coherence interferometry technique to the dimensional characterization of large opaque mechanical parts as well as microdeformations experienced by them. The implemented scheme is capable of simultaneously measuring very small deformations and relatively large dimensions or thicknesses (several centimeters) of the sample. By applying the chirp Fourier transform algorithm, it was possible to measure changes in thickness with an uncertainty of 0.35  μm when a 7-cm-thick sample was measured. The measurement scheme was implemented in optical fiber, which makes it highly adaptable to industrial conditions. It employs a tunable light source and a Sagnac–Michelson configuration of the interferometric system that allows the thickness of the opaque sample and the topography of both faces to be obtained simultaneously. The developed system can be used to perform profilometry of opaque samples and to analyze the dimensional behavior of mechanical pieces in production lines or under mechanical efforts capable of introducing some deformations on them. This feature enables the system to perform quality control in manufacturing processes.
format Artículo
publishedVersion
author Torga, Jorge
Morel, Eneas
Russo, Nélida A.
Duchowicz, Ricardo
author_facet Torga, Jorge
Morel, Eneas
Russo, Nélida A.
Duchowicz, Ricardo
author_sort Torga, Jorge
title Dimensional characterization of large opaque samples and microdeformations by low coherence interferometry
title_short Dimensional characterization of large opaque samples and microdeformations by low coherence interferometry
title_full Dimensional characterization of large opaque samples and microdeformations by low coherence interferometry
title_fullStr Dimensional characterization of large opaque samples and microdeformations by low coherence interferometry
title_full_unstemmed Dimensional characterization of large opaque samples and microdeformations by low coherence interferometry
title_sort dimensional characterization of large opaque samples and microdeformations by low coherence interferometry
publishDate 2020
url http://hdl.handle.net/20.500.12272/4283
work_keys_str_mv AT torgajorge dimensionalcharacterizationoflargeopaquesamplesandmicrodeformationsbylowcoherenceinterferometry
AT moreleneas dimensionalcharacterizationoflargeopaquesamplesandmicrodeformationsbylowcoherenceinterferometry
AT russonelidaa dimensionalcharacterizationoflargeopaquesamplesandmicrodeformationsbylowcoherenceinterferometry
AT duchowiczricardo dimensionalcharacterizationoflargeopaquesamplesandmicrodeformationsbylowcoherenceinterferometry
bdutipo_str Repositorios
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