Low-coherence interferometry measurement of filling in porous silicon

The determination of capillary filling dynamics in nanoporous structures and, in particular, the analysis of the filling fraction profile in the advancing wet front have been proposed as possible methods for characterizing the pore distribution of these structures. Furthermore, the filling dynamics...

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Autores principales: Sallese, Marcelo, Torga, Jorge, Budini, Nicolás, Urteaga, Raúl
Formato: Documento de conferencia publishedVersion
Lenguaje:Inglés
Publicado: 2020
Materias:
low-coherence interferometry
porous silicon capillary filling
wet front broadening porosimetry
Acceso en línea:http://hdl.handle.net/20.500.12272/4269
Aporte de:
RIA - Repositorio Institucional Abierto (UTN) de Universidad Tecnológica Nacional
id I68-R174-20.500.12272-4269
record_format dspace
institution Universidad Tecnológica Nacional
institution_str I-68
repository_str R-174
collection RIA - Repositorio Institucional Abierto (UTN)
language Inglés
topic low-coherence interferometry
porous silicon capillary filling
wet front broadening porosimetry
spellingShingle low-coherence interferometry
porous silicon capillary filling
wet front broadening porosimetry
Sallese, Marcelo
Torga, Jorge
Budini, Nicolás
Urteaga, Raúl
Low-coherence interferometry measurement of filling in porous silicon
topic_facet low-coherence interferometry
porous silicon capillary filling
wet front broadening porosimetry
description The determination of capillary filling dynamics in nanoporous structures and, in particular, the analysis of the filling fraction profile in the advancing wet front have been proposed as possible methods for characterizing the pore distribution of these structures. Furthermore, the filling dynamics in nanoporous structures of known morphology allows studying fluid properties under conditions of strong spatial confinement. In this work we determine the capillary filling dynamics of porous silicon structures using low-coherence interferometry. When the liquid enters the porous structure there is an increase in the optical thickness of the layer. The determination of optical thickness as a function of position and time allows monitoring capillary filling dynamics. The high spatial resolution of this technique allows to analyze the wet front broadening, which can be used to obtain information about the pore distribution in the sample
format Documento de conferencia
publishedVersion
author Sallese, Marcelo
Torga, Jorge
Budini, Nicolás
Urteaga, Raúl
author_facet Sallese, Marcelo
Torga, Jorge
Budini, Nicolás
Urteaga, Raúl
author_sort Sallese, Marcelo
title Low-coherence interferometry measurement of filling in porous silicon
title_short Low-coherence interferometry measurement of filling in porous silicon
title_full Low-coherence interferometry measurement of filling in porous silicon
title_fullStr Low-coherence interferometry measurement of filling in porous silicon
title_full_unstemmed Low-coherence interferometry measurement of filling in porous silicon
title_sort low-coherence interferometry measurement of filling in porous silicon
publishDate 2020
url http://hdl.handle.net/20.500.12272/4269
work_keys_str_mv AT sallesemarcelo lowcoherenceinterferometrymeasurementoffillinginporoussilicon
AT torgajorge lowcoherenceinterferometrymeasurementoffillinginporoussilicon
AT budininicolas lowcoherenceinterferometrymeasurementoffillinginporoussilicon
AT urteagaraul lowcoherenceinterferometrymeasurementoffillinginporoussilicon
bdutipo_str Repositorios
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