The influence of experimental resolution and bakground upon ion-induced (ve = vi) electron distribution measured behind solid foils.

Fil: Chiu, K. C. R. Comisión Nacional de Energía Atómica; Argentina

Guardado en:
Detalles Bibliográficos
Autores principales: Chiu, K. C. R., Meckbach, W., Sánchez Sarmiento, G., Mc Gowan, J. W.
Lenguaje:Inglés
Publicado: IOP Publishing 1979
Materias:
DISTRIBUTION CONSTANTS
IONS
CHARGE DISTRIBUTION
ION BEAMS
ATOMIC BEAMS
Acceso en línea:https://nuclea.cnea.gob.ar/handle/20.500.12553/1988
Aporte de:
Nuclea - Repositorio Institucional de la Comisión Nacional de Energía Atómica (CNEA) de Comisión Nacional de Energía Atómica (CNEA)
id I64-R170-20.500.12553-1988
record_format dspace
spelling I64-R170-20.500.12553-19882025-07-16T23:32:04Z The influence of experimental resolution and bakground upon ion-induced (ve = vi) electron distribution measured behind solid foils. Chiu, K. C. R. Meckbach, W. Sánchez Sarmiento, G. Mc Gowan, J. W. DISTRIBUTION CONSTANTS IONS CHARGE DISTRIBUTION ION BEAMS ATOMIC BEAMS Fil: Chiu, K. C. R. Comisión Nacional de Energía Atómica; Argentina Meckbach, W. Comisión Nacional de Energía Atómica; Argentina Sánchez Sarmiento, G. Comisión Nacional de Energía Atómica; Argentina Mc Gowan, J. W. Comisión Nacional de Energía Atómica; Argentina Comisión Nacional de Energía Atómica; Argentina IOP Publishing 1979 info:eu-repo/semantics/openAccess application/pdf https://nuclea.cnea.gob.ar/handle/20.500.12553/1988 eng Journal of Physics B: Atomic, Molecular, and Optical Physics V.12 (5) 1979
institution Comisión Nacional de Energía Atómica (CNEA)
institution_str I-64
repository_str R-170
collection Nuclea - Repositorio Institucional de la Comisión Nacional de Energía Atómica (CNEA)
language Inglés
topic DISTRIBUTION CONSTANTS
IONS
CHARGE DISTRIBUTION
ION BEAMS
ATOMIC BEAMS
spellingShingle DISTRIBUTION CONSTANTS
IONS
CHARGE DISTRIBUTION
ION BEAMS
ATOMIC BEAMS
Chiu, K. C. R.
Meckbach, W.
Sánchez Sarmiento, G.
Mc Gowan, J. W.
The influence of experimental resolution and bakground upon ion-induced (ve = vi) electron distribution measured behind solid foils.
topic_facet DISTRIBUTION CONSTANTS
IONS
CHARGE DISTRIBUTION
ION BEAMS
ATOMIC BEAMS
description Fil: Chiu, K. C. R. Comisión Nacional de Energía Atómica; Argentina
author Chiu, K. C. R.
Meckbach, W.
Sánchez Sarmiento, G.
Mc Gowan, J. W.
author_facet Chiu, K. C. R.
Meckbach, W.
Sánchez Sarmiento, G.
Mc Gowan, J. W.
author_sort Chiu, K. C. R.
title The influence of experimental resolution and bakground upon ion-induced (ve = vi) electron distribution measured behind solid foils.
title_short The influence of experimental resolution and bakground upon ion-induced (ve = vi) electron distribution measured behind solid foils.
title_full The influence of experimental resolution and bakground upon ion-induced (ve = vi) electron distribution measured behind solid foils.
title_fullStr The influence of experimental resolution and bakground upon ion-induced (ve = vi) electron distribution measured behind solid foils.
title_full_unstemmed The influence of experimental resolution and bakground upon ion-induced (ve = vi) electron distribution measured behind solid foils.
title_sort influence of experimental resolution and bakground upon ion-induced (ve = vi) electron distribution measured behind solid foils.
publisher IOP Publishing
publishDate 1979
url https://nuclea.cnea.gob.ar/handle/20.500.12553/1988
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