High resistance scaling from 10 k[omega] and QHR standards using a Cryogenic Current Comparator

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Detalles Bibliográficos
Autores principales: Bierzychudek, Marcos E., Elmquist, Randolf E., Jones, G. R., Pritchard, B., Hernández, F., Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, AR, National Measurement Institute. West Lindfield, AU, Centro Nacional de Metrología. Querétaro, MX, Conference on Precision Electromagnetic Measurements. CPEM
Formato: other
Lenguaje:Inglés
Publicado: IEEE 2008
Materias:
Resistencia eléctrica
Instrumentos de medición
Comparadores
Criogenia
Metrología
Acceso en línea:http://www-biblio.inti.gob.ar:80/gsdl/collect/inti/index/assoc/HASHf63a/b2085e25.dir/doc.pdf
Aporte de:
Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI) de INTI
id I60-R166HASHf63ab2085e25860001db57
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institution INTI
institution_str I-60
repository_str R-166
collection Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
language Inglés
orig_language_str_mv eng
topic Resistencia eléctrica
Instrumentos de medición
Comparadores
Criogenia
Metrología
spellingShingle Resistencia eléctrica
Instrumentos de medición
Comparadores
Criogenia
Metrología
Bierzychudek, Marcos E.
Elmquist, Randolf E.
Jones, G. R.
Pritchard, B.
Hernández, F.
Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, AR
National Measurement Institute. West Lindfield, AU
Centro Nacional de Metrología. Querétaro, MX
Conference on Precision Electromagnetic Measurements. CPEM
High resistance scaling from 10 k[omega] and QHR standards using a Cryogenic Current Comparator
format other
author Bierzychudek, Marcos E.
Elmquist, Randolf E.
Jones, G. R.
Pritchard, B.
Hernández, F.
Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, AR
National Measurement Institute. West Lindfield, AU
Centro Nacional de Metrología. Querétaro, MX
Conference on Precision Electromagnetic Measurements. CPEM
author_facet Bierzychudek, Marcos E.
Elmquist, Randolf E.
Jones, G. R.
Pritchard, B.
Hernández, F.
Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires, AR
National Measurement Institute. West Lindfield, AU
Centro Nacional de Metrología. Querétaro, MX
Conference on Precision Electromagnetic Measurements. CPEM
author_sort Bierzychudek, Marcos E.
title High resistance scaling from 10 k[omega] and QHR standards using a Cryogenic Current Comparator
title_short High resistance scaling from 10 k[omega] and QHR standards using a Cryogenic Current Comparator
title_full High resistance scaling from 10 k[omega] and QHR standards using a Cryogenic Current Comparator
title_fullStr High resistance scaling from 10 k[omega] and QHR standards using a Cryogenic Current Comparator
title_full_unstemmed High resistance scaling from 10 k[omega] and QHR standards using a Cryogenic Current Comparator
title_sort high resistance scaling from 10 k[omega] and qhr standards using a cryogenic current comparator
publisher IEEE
publishDate 2008
url http://www-biblio.inti.gob.ar:80/gsdl/collect/inti/index/assoc/HASHf63a/b2085e25.dir/doc.pdf
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