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institution INTI
institution_str I-60
repository_str R-166
collection Repositorio Institucional del Instituto Nacional de Tecnología Industrial (INTI)
language Inglés
orig_language_str_mv eng
topic Mediciones eléctricas
Metales
Aluminio
Oro
Semiconductores
Temperatura
Voltaje
spellingShingle Mediciones eléctricas
Metales
Aluminio
Oro
Semiconductores
Temperatura
Voltaje
Txoperena, Oihana
Gobbi, Marco
Bedoya-Pinto, Amilcar
Golmar, Federico
Sun, Xiangnan
Hueso, Luis E.
Casanova, Félix
CIC nanoGUNE. Donostia – San Sebastián, ES
INTI-Electrónica e Informática. Buenos Aires, AR
IKERBASQUE, Basque Foundation for Science. Bilbao, ES
How reliable are Hanle measurements in metals in a three-terminal geometry?
format article
author Txoperena, Oihana
Gobbi, Marco
Bedoya-Pinto, Amilcar
Golmar, Federico
Sun, Xiangnan
Hueso, Luis E.
Casanova, Félix
CIC nanoGUNE. Donostia – San Sebastián, ES
INTI-Electrónica e Informática. Buenos Aires, AR
IKERBASQUE, Basque Foundation for Science. Bilbao, ES
author_facet Txoperena, Oihana
Gobbi, Marco
Bedoya-Pinto, Amilcar
Golmar, Federico
Sun, Xiangnan
Hueso, Luis E.
Casanova, Félix
CIC nanoGUNE. Donostia – San Sebastián, ES
INTI-Electrónica e Informática. Buenos Aires, AR
IKERBASQUE, Basque Foundation for Science. Bilbao, ES
author_sort Txoperena, Oihana
title How reliable are Hanle measurements in metals in a three-terminal geometry?
title_short How reliable are Hanle measurements in metals in a three-terminal geometry?
title_full How reliable are Hanle measurements in metals in a three-terminal geometry?
title_fullStr How reliable are Hanle measurements in metals in a three-terminal geometry?
title_full_unstemmed How reliable are Hanle measurements in metals in a three-terminal geometry?
title_sort how reliable are hanle measurements in metals in a three-terminal geometry?
publisher American Institute of Physics
publishDate 2013
url http://www-biblio.inti.gob.ar:80/gsdl/collect/inti/index/assoc/HASH1dd5.dir/doc.pdf
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