Cita APA (7a ed.)

Sánchez, E. Y., Represa, S., Mellado, D., Balbi, K. B., Acquesta, A. D., Colman Lerner, J. E., & Porta, A. A. (2022). Risk analysis of technological hazards: Simulation of scenarios and application of a local vulnerability index. Elsevier.

Cita Chicago Style (17a ed.)

Sánchez, E. Y., S. Represa, D. Mellado, K. B. Balbi, Alejandro Dante Acquesta, J. E. Colman Lerner, y A. A. Porta. Risk Analysis of Technological Hazards: Simulation of Scenarios and Application of a Local Vulnerability Index. Elsevier, 2022.

Cita MLA (8a ed.)

Sánchez, E. Y., et al. Risk Analysis of Technological Hazards: Simulation of Scenarios and Application of a Local Vulnerability Index. Elsevier, 2022.