Analysis of the impact of artificial networks in system-level EMC tests

The impedance of an Off-The-Shelf Artificial Network (OTS-AN) and a custom made High-Frequency Artificial Network (HF-AN) were analysed and compared. It is showed that in order to meet the requirements of automotive standards, such as Bulk Current Injection (BCI) from ISO 11452-4 as well as both Con...

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Autores principales: Gardella, Pablo J., Mariani, Eduardo
Formato: Artículo de publicación periódica
Lenguaje:Inglés
Publicado: 2024
Materias:
REDES ARTIFICIALES
ANÁLISIS DE IMPACTO
PRUEBAS EMC
Acceso en línea:https://ri.itba.edu.ar/handle/20.500.14769/4462
Aporte de:
Repositorio Institucional Instituto Tecnológico de Buenos Aires (ITBA) de Instituto Tecnológico de Buenos Aires (ITBA)
id I32-R138-20.500.14769-4462
record_format dspace
spelling I32-R138-20.500.14769-44622026-01-15T15:30:59Z Analysis of the impact of artificial networks in system-level EMC tests Gardella, Pablo J. Mariani, Eduardo REDES ARTIFICIALES ANÁLISIS DE IMPACTO PRUEBAS EMC The impedance of an Off-The-Shelf Artificial Network (OTS-AN) and a custom made High-Frequency Artificial Network (HF-AN) were analysed and compared. It is showed that in order to meet the requirements of automotive standards, such as Bulk Current Injection (BCI) from ISO 11452-4 as well as both Conducted and Radiated Emissions (CE, RE) from CISPR 25, the HF-AN is needed. System-level circuit simulations were run using S-parameters for quantifying the impact of these two models in the previously mentioned EMC tests. Above 50 MHz, up to 3.5 dB and 4.3 dB differences were found on the transferimpedance of CE and in the Common-Mode to Differential-Mode conversion of BCI, respectively. On the other hand, in RE the OTS-AN leaded to an overestimation of the emission profile in the 300 MHz and 800 MHz band as high as 5.3 dB. Besides that, it is showed that the OTS-AN behaves as a source of non-constant uncertainty, specially above 50 MHz. Finally, the issues in terms of reproducibility, repeatability and accuracy that arise from the non-RF connectors in the OTS-AN are discussed and a metric for test-bench comparison and validation is proposed. 2024-05-07T17:28:38Z 2024-05-07T17:28:38Z 2022 Artículo de publicación periódica https://ri.itba.edu.ar/handle/20.500.14769/4462 en application/pdf
institution Instituto Tecnológico de Buenos Aires (ITBA)
institution_str I-32
repository_str R-138
collection Repositorio Institucional Instituto Tecnológico de Buenos Aires (ITBA)
language Inglés
topic REDES ARTIFICIALES
ANÁLISIS DE IMPACTO
PRUEBAS EMC
spellingShingle REDES ARTIFICIALES
ANÁLISIS DE IMPACTO
PRUEBAS EMC
Gardella, Pablo J.
Mariani, Eduardo
Analysis of the impact of artificial networks in system-level EMC tests
topic_facet REDES ARTIFICIALES
ANÁLISIS DE IMPACTO
PRUEBAS EMC
description The impedance of an Off-The-Shelf Artificial Network (OTS-AN) and a custom made High-Frequency Artificial Network (HF-AN) were analysed and compared. It is showed that in order to meet the requirements of automotive standards, such as Bulk Current Injection (BCI) from ISO 11452-4 as well as both Conducted and Radiated Emissions (CE, RE) from CISPR 25, the HF-AN is needed. System-level circuit simulations were run using S-parameters for quantifying the impact of these two models in the previously mentioned EMC tests. Above 50 MHz, up to 3.5 dB and 4.3 dB differences were found on the transferimpedance of CE and in the Common-Mode to Differential-Mode conversion of BCI, respectively. On the other hand, in RE the OTS-AN leaded to an overestimation of the emission profile in the 300 MHz and 800 MHz band as high as 5.3 dB. Besides that, it is showed that the OTS-AN behaves as a source of non-constant uncertainty, specially above 50 MHz. Finally, the issues in terms of reproducibility, repeatability and accuracy that arise from the non-RF connectors in the OTS-AN are discussed and a metric for test-bench comparison and validation is proposed.
format Artículo de publicación periódica
author Gardella, Pablo J.
Mariani, Eduardo
author_facet Gardella, Pablo J.
Mariani, Eduardo
author_sort Gardella, Pablo J.
title Analysis of the impact of artificial networks in system-level EMC tests
title_short Analysis of the impact of artificial networks in system-level EMC tests
title_full Analysis of the impact of artificial networks in system-level EMC tests
title_fullStr Analysis of the impact of artificial networks in system-level EMC tests
title_full_unstemmed Analysis of the impact of artificial networks in system-level EMC tests
title_sort analysis of the impact of artificial networks in system-level emc tests
publishDate 2024
url https://ri.itba.edu.ar/handle/20.500.14769/4462
work_keys_str_mv AT gardellapabloj analysisoftheimpactofartificialnetworksinsystemlevelemctests
AT marianieduardo analysisoftheimpactofartificialnetworksinsystemlevelemctests
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