Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration

"Technology developments are demanding increasingly stringent requirements in terms of Electromagnetic Com patibility (EMC). For IC designers, this implies increasing Power Supply Rejection (PSR) while at the same time reducing the Icc spectrum. This work provides a theoretical analysis of the...

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Detalles Bibliográficos
Autores principales: Ledesma, Francisco Daniel, Dutriez Diaz, Philippe, Scapolla, Franco, Lin, Xi, Gardella, Pablo
Formato: Ponencias en Congresos acceptedVersion
Lenguaje:Inglés
Publicado: 2022
Materias:
COMPATIBILIDAD ELECTROMAGNETICA
CORRIENTES ELECTRICAS
Acceso en línea:https://ri.itba.edu.ar/handle/123456789/3991
Aporte de:
Repositorio Institucional Instituto Tecnológico de Buenos Aires (ITBA) de Instituto Tecnológico de Buenos Aires (ITBA)
id I32-R138-123456789-3991
record_format dspace
spelling I32-R138-123456789-39912022-12-07T14:13:34Z Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration Ledesma, Francisco Daniel Dutriez Diaz, Philippe Scapolla, Franco Lin, Xi Gardella, Pablo COMPATIBILIDAD ELECTROMAGNETICA CORRIENTES ELECTRICAS "Technology developments are demanding increasingly stringent requirements in terms of Electromagnetic Com patibility (EMC). For IC designers, this implies increasing Power Supply Rejection (PSR) while at the same time reducing the Icc spectrum. This work provides a theoretical analysis of the Peak Current Source with emitter degeneration (PCS-ED), a well known current mirror to achieve high PSR, which gets improved even further by the emitter resistance. The trade-off between the output current and the PSR were analyzed, as well as a sensitivity analysis to quantify the effects of the emitter degeneration. Experimental measurements have been performed to validate the immunity of an off-the-shelf bipolar transistor array from 100kHz up to 1GHz. Results showed that despite the small-signal analyses predicted a considerable improvement, the non-linear effects introduced by the input stage remained as the limiting factor in terms of PSR, leading to similar responses in the Peak Current Source (PCS) and the PCS-ED, despite one having much larger PSR than the other." 2022-11-11T17:04:18Z 2022-11-11T17:04:18Z 2022 Ponencias en Congresos info:eu-repo/semantics/acceptedVersion https://ri.itba.edu.ar/handle/123456789/3991 en info:eu-repo/semantics/altIdentifier/doi/10.1109/CAE54497.2022.9762507 application/pdf
institution Instituto Tecnológico de Buenos Aires (ITBA)
institution_str I-32
repository_str R-138
collection Repositorio Institucional Instituto Tecnológico de Buenos Aires (ITBA)
language Inglés
topic COMPATIBILIDAD ELECTROMAGNETICA
CORRIENTES ELECTRICAS
spellingShingle COMPATIBILIDAD ELECTROMAGNETICA
CORRIENTES ELECTRICAS
Ledesma, Francisco Daniel
Dutriez Diaz, Philippe
Scapolla, Franco
Lin, Xi
Gardella, Pablo
Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration
topic_facet COMPATIBILIDAD ELECTROMAGNETICA
CORRIENTES ELECTRICAS
description "Technology developments are demanding increasingly stringent requirements in terms of Electromagnetic Com patibility (EMC). For IC designers, this implies increasing Power Supply Rejection (PSR) while at the same time reducing the Icc spectrum. This work provides a theoretical analysis of the Peak Current Source with emitter degeneration (PCS-ED), a well known current mirror to achieve high PSR, which gets improved even further by the emitter resistance. The trade-off between the output current and the PSR were analyzed, as well as a sensitivity analysis to quantify the effects of the emitter degeneration. Experimental measurements have been performed to validate the immunity of an off-the-shelf bipolar transistor array from 100kHz up to 1GHz. Results showed that despite the small-signal analyses predicted a considerable improvement, the non-linear effects introduced by the input stage remained as the limiting factor in terms of PSR, leading to similar responses in the Peak Current Source (PCS) and the PCS-ED, despite one having much larger PSR than the other."
format Ponencias en Congresos
acceptedVersion
author Ledesma, Francisco Daniel
Dutriez Diaz, Philippe
Scapolla, Franco
Lin, Xi
Gardella, Pablo
author_facet Ledesma, Francisco Daniel
Dutriez Diaz, Philippe
Scapolla, Franco
Lin, Xi
Gardella, Pablo
author_sort Ledesma, Francisco Daniel
title Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration
title_short Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration
title_full Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration
title_fullStr Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration
title_full_unstemmed Power supply rejection and sensitivity analyses of a peak current source with emitter degeneration
title_sort power supply rejection and sensitivity analyses of a peak current source with emitter degeneration
publishDate 2022
url https://ri.itba.edu.ar/handle/123456789/3991
work_keys_str_mv AT ledesmafranciscodaniel powersupplyrejectionandsensitivityanalysesofapeakcurrentsourcewithemitterdegeneration
AT dutriezdiazphilippe powersupplyrejectionandsensitivityanalysesofapeakcurrentsourcewithemitterdegeneration
AT scapollafranco powersupplyrejectionandsensitivityanalysesofapeakcurrentsourcewithemitterdegeneration
AT linxi powersupplyrejectionandsensitivityanalysesofapeakcurrentsourcewithemitterdegeneration
AT gardellapablo powersupplyrejectionandsensitivityanalysesofapeakcurrentsourcewithemitterdegeneration
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