Isotropic-anisotropic interfaces: an algorithm to characterize reflection and refraction
The detailed study of the response of anisotropic linear materials to electromagnetic fields has as one of its aims the design of new devices of interest in Optics, Optoelectronics and Electronics. In this paper we present a simple computer tool that is able to determine the characteristics of the p...
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| Autores principales: | , , , |
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| Formato: | Artículo publishedVersion |
| Lenguaje: | Español |
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FIUBA
2019
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| Materias: | |
| Acceso en línea: | https://elektron.fi.uba.ar/elektron/article/view/77 https://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=elektron&d=77_oai |
| Aporte de: |
| Sumario: | The detailed study of the response of anisotropic linear materials to electromagnetic fields has as one of its aims the design of new devices of interest in Optics, Optoelectronics and Electronics. In this paper we present a simple computer tool that is able to determine the characteristics of the propagation of plane waves through an isotropic-anisotropic uniaxial interface with arbitrary direction of the optical axis with respect to the direction of incidence. The algorithms were checked with the analytical results in cases where the incidence plane coincides with each of the principal planes of the crystal. |
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