Isotropic-anisotropic interfaces: an algorithm to characterize reflection and refraction
The detailed study of the response of anisotropic linear materials to electromagnetic fields has as one of its aims the design of new devices of interest in Optics, Optoelectronics and Electronics. In this paper we present a simple computer tool that is able to determine the characteristics of the p...
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| Formato: | Artículo publishedVersion |
| Lenguaje: | Español |
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FIUBA
2019
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| Acceso en línea: | https://elektron.fi.uba.ar/elektron/article/view/77 https://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=elektron&d=77_oai |
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I28-R145-77_oai2026-02-11 Caro, Germán Acosta, Eduardo Omar Veiras, Francisco Perez, Lilianan 2019-12-15 The detailed study of the response of anisotropic linear materials to electromagnetic fields has as one of its aims the design of new devices of interest in Optics, Optoelectronics and Electronics. In this paper we present a simple computer tool that is able to determine the characteristics of the propagation of plane waves through an isotropic-anisotropic uniaxial interface with arbitrary direction of the optical axis with respect to the direction of incidence. The algorithms were checked with the analytical results in cases where the incidence plane coincides with each of the principal planes of the crystal. El estudio detallado de la respuesta de los materiales lineales anisótropos ante campos electromagnéticos tiene como uno de sus fines el de diseñar nuevos dispositivos de interés en Óptica, Optoelectrónica y Electrónica. En este trabajo presentamos una herramienta numérica sencilla que es capaz de determinar las características de la propagación de las ondas planas a través de una interfaz isótropo-anisótropo uniaxial con dirección arbitraria del eje óptico respecto a la dirección de incidencia. Los algoritmos fueron comprobados con los resultados analíticos en los casos en que el plano de incidencia coincide con cada uno de los planos principales del cristal. application/pdf text/html https://elektron.fi.uba.ar/elektron/article/view/77 10.37537/rev.elektron.3.2.77.2019 spa FIUBA https://elektron.fi.uba.ar/elektron/article/view/77/118 https://elektron.fi.uba.ar/elektron/article/view/77/127 Derechos de autor 2019 Eduardo Omar Acosta Elektron Journal; Vol. 3 No. 2 (2019); 103-111 Revista Elektron; Vol. 3 Núm. 2 (2019); 103-111 Revista Elektron; v. 3 n. 2 (2019); 103-111 2525-0159 2525-0159 anisotropy transmission optoelectronic devices anisotropía transmisión dispositivos optoelectrónicos Isotropic-anisotropic interfaces: an algorithm to characterize reflection and refraction Interfaces isótropo-anisótropo: un código numérico para caracterizar la reflexión y refracción info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion https://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=elektron&d=77_oai |
| institution |
Universidad de Buenos Aires |
| institution_str |
I-28 |
| repository_str |
R-145 |
| collection |
Repositorio Digital de la Universidad de Buenos Aires (UBA) |
| language |
Español |
| orig_language_str_mv |
spa |
| topic |
anisotropy transmission optoelectronic devices anisotropía transmisión dispositivos optoelectrónicos |
| spellingShingle |
anisotropy transmission optoelectronic devices anisotropía transmisión dispositivos optoelectrónicos Caro, Germán Acosta, Eduardo Omar Veiras, Francisco Perez, Lilianan Isotropic-anisotropic interfaces: an algorithm to characterize reflection and refraction |
| topic_facet |
anisotropy transmission optoelectronic devices anisotropía transmisión dispositivos optoelectrónicos |
| description |
The detailed study of the response of anisotropic linear materials to electromagnetic fields has as one of its aims the design of new devices of interest in Optics, Optoelectronics and Electronics. In this paper we present a simple computer tool that is able to determine the characteristics of the propagation of plane waves through an isotropic-anisotropic uniaxial interface with arbitrary direction of the optical axis with respect to the direction of incidence. The algorithms were checked with the analytical results in cases where the incidence plane coincides with each of the principal planes of the crystal. |
| format |
Artículo publishedVersion |
| author |
Caro, Germán Acosta, Eduardo Omar Veiras, Francisco Perez, Lilianan |
| author_facet |
Caro, Germán Acosta, Eduardo Omar Veiras, Francisco Perez, Lilianan |
| author_sort |
Caro, Germán |
| title |
Isotropic-anisotropic interfaces: an algorithm to characterize reflection and refraction |
| title_short |
Isotropic-anisotropic interfaces: an algorithm to characterize reflection and refraction |
| title_full |
Isotropic-anisotropic interfaces: an algorithm to characterize reflection and refraction |
| title_fullStr |
Isotropic-anisotropic interfaces: an algorithm to characterize reflection and refraction |
| title_full_unstemmed |
Isotropic-anisotropic interfaces: an algorithm to characterize reflection and refraction |
| title_sort |
isotropic-anisotropic interfaces: an algorithm to characterize reflection and refraction |
| publisher |
FIUBA |
| publishDate |
2019 |
| url |
https://elektron.fi.uba.ar/elektron/article/view/77 https://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=elektron&d=77_oai |
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| _version_ |
1859522279123189760 |