Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns

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In this work we present an optical method for the direct determination of the piezoelectric coefficient of polymeric thin films. This is achieved through the measurement of nanometric mechanical displacements generated in the film when it is excited by low frequency harmonic electrical signals (0.5...

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Autores principales: Etchepareborda, Pablo, Veiras, Francisco, Bianchetti, Arturo, Federico, Alejandro, Gonzalez, Martin German
Formato: Artículo publishedVersion
Lenguaje:Español
Publicado: FIUBA 2019
Materias:
speckle
bivariate empirical mode descomposition
piezoelectric polymer
descomposición de modos empíricos bivariados
polímero piezoeléctrico
Acceso en línea:https://elektron.fi.uba.ar/elektron/article/view/76
https://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=elektron&d=76_oai
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id I28-R145-76_oai
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spelling I28-R145-76_oai2026-02-11 Etchepareborda, Pablo Veiras, Francisco Bianchetti, Arturo Federico, Alejandro Gonzalez, Martin German 2019-06-15 In this work we present an optical method for the direct determination of the piezoelectric coefficient of polymeric thin films. This is achieved through the measurement of nanometric mechanical displacements generated in the film when it is excited by low frequency harmonic electrical signals (0.5 Hz). The system is based on the temporal speckle pattern interferometry technique and the recovery of phase by using a bivariate empirical mode decomposition framework. The experimental scheme was used on a sample of vinylidene polyfluoride deposited on a glass substrate. The sample presents similar conditions to those found in the characterization of complex fluids by photoacoustic techniques. The measured value agrees with those obtained by other methods and with the value reported by the manufacturer. En este trabajo se presenta un método óptico para la determinación directa del coeficiente piezoeléctrico de películas delgadas de material polimérico. Esto se logra a través de la medición de desplazamientos mecánicos nanométricos generados en el film cuando es excitado con señales eléctricas armónicas de baja frecuencia (0.5 Hz). El sistema está basado en la inteferometría temporal de patrones de speckle y en la recuperación de fase por descomposición en modos empíricos bivariada. El esquema experimental fue usado sobre una muestra de polifluoruro de vinilideno depositada sobre un substrato de vidrio que presenta condiciones de contorno similares a las que se encuentran en experiencias de caracterización de fluídos complejos por técnicas fotoacústicas. El valor medido concuerda con aquellos obtenidos por otros métodos y con el reportado por el fabricante. application/pdf text/html https://elektron.fi.uba.ar/elektron/article/view/76 10.37537/rev.elektron.3.1.76.2019 spa FIUBA https://elektron.fi.uba.ar/elektron/article/view/76/70 https://elektron.fi.uba.ar/elektron/article/view/76/112 Derechos de autor 2019 Pablo Etchepareborda Elektron Journal; Vol. 3 No. 1 (2019); 52-57 Revista Elektron; Vol. 3 Núm. 1 (2019); 52-57 Revista Elektron; v. 3 n. 1 (2019); 52-57 2525-0159 2525-0159 speckle bivariate empirical mode descomposition piezoelectric polymer speckle descomposición de modos empíricos bivariados polímero piezoeléctrico Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns Medición de desplazamientos nanométricos en polímeros piezoeléctricos usando método de descomposición en modos empíricos bivariados en patrones de speckle info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion https://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=elektron&d=76_oai
institution Universidad de Buenos Aires
institution_str I-28
repository_str R-145
collection Repositorio Digital de la Universidad de Buenos Aires (UBA)
language Español
orig_language_str_mv spa
topic speckle
bivariate empirical mode descomposition
piezoelectric polymer
speckle
descomposición de modos empíricos bivariados
polímero piezoeléctrico
spellingShingle speckle
bivariate empirical mode descomposition
piezoelectric polymer
speckle
descomposición de modos empíricos bivariados
polímero piezoeléctrico
Etchepareborda, Pablo
Veiras, Francisco
Bianchetti, Arturo
Federico, Alejandro
Gonzalez, Martin German
Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns
topic_facet speckle
bivariate empirical mode descomposition
piezoelectric polymer
speckle
descomposición de modos empíricos bivariados
polímero piezoeléctrico
description In this work we present an optical method for the direct determination of the piezoelectric coefficient of polymeric thin films. This is achieved through the measurement of nanometric mechanical displacements generated in the film when it is excited by low frequency harmonic electrical signals (0.5 Hz). The system is based on the temporal speckle pattern interferometry technique and the recovery of phase by using a bivariate empirical mode decomposition framework. The experimental scheme was used on a sample of vinylidene polyfluoride deposited on a glass substrate. The sample presents similar conditions to those found in the characterization of complex fluids by photoacoustic techniques. The measured value agrees with those obtained by other methods and with the value reported by the manufacturer.
format Artículo
publishedVersion
author Etchepareborda, Pablo
Veiras, Francisco
Bianchetti, Arturo
Federico, Alejandro
Gonzalez, Martin German
author_facet Etchepareborda, Pablo
Veiras, Francisco
Bianchetti, Arturo
Federico, Alejandro
Gonzalez, Martin German
author_sort Etchepareborda, Pablo
title Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns
title_short Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns
title_full Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns
title_fullStr Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns
title_full_unstemmed Nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns
title_sort nanometric displacements measurement in piezoelectric polymers using bivariate empirical mode decomposition method in speckle patterns
publisher FIUBA
publishDate 2019
url https://elektron.fi.uba.ar/elektron/article/view/76
https://repositoriouba.sisbi.uba.ar/gsdl/cgi-bin/library.cgi?a=d&c=elektron&d=76_oai
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