Sambuco Salomone, L., Garcia-Inza, M., Carbonetto, S., & Faigón, A. (2021). Numerical modeling of radiation-induced charge loss in CMOS floating gate cells. FIUBA.
Cita Chicago Style (17a ed.)Sambuco Salomone, Lucas, Mariano Garcia-Inza, Sebastián Carbonetto, y Adrián Faigón. Numerical Modeling of Radiation-induced Charge Loss in CMOS Floating Gate Cells. FIUBA, 2021.
Cita MLA (8a ed.)Sambuco Salomone, Lucas, et al. Numerical Modeling of Radiation-induced Charge Loss in CMOS Floating Gate Cells. FIUBA, 2021.
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