Optical and electrical properties of nanostructured metallic electrical contacts

Mostrar todas las versiones(2)

We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Toranzos, Victor J., Ortiz, Guillermo P., Mochán, W. Luis, Zerbino, Jorge Omar
Formato: Articulo
Lenguaje:Inglés
Publicado: 2017
Materias:
Física
Effective media
Hotspots
Recursive algorithms
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/87462
Aporte de:
SEDICI (UNLP) de Universidad Nacional de La Plata
id I19-R120-10915-87462
record_format dspace
institution Universidad Nacional de La Plata
institution_str I-19
repository_str R-120
collection SEDICI (UNLP)
language Inglés
topic Física
Effective media
Hotspots
Recursive algorithms
spellingShingle Física
Effective media
Hotspots
Recursive algorithms
Toranzos, Victor J.
Ortiz, Guillermo P.
Mochán, W. Luis
Zerbino, Jorge Omar
Optical and electrical properties of nanostructured metallic electrical contacts
topic_facet Física
Effective media
Hotspots
Recursive algorithms
description We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their ellipsometric coefficients, optical transmissions and electrical conductivity for different widths, and we employ an efficient recursive method to calculate their macroscopic dielectric function, their optical properties and their microscopic electric fields. The topology of very thin films corresponds to disconnected islands, while very wide films are simply connected. For intermediate widths the film becomes semicontinuous, multiply connected, and its microscopic electric field develops hotspots at optical resonances which appear near the percolation threshold of the conducting phase, yielding large ohmic losses that increase the absorptance above that of a corresponding homogeneous film. Optimizing the thickness of the film to maximize its transmittance above the percolation threshold of the conductive phase we obtained a film with transmittance T = 0.41 and a sheet resistance Rsmax ≈ 2.7 Ω. We also analyze the observed emission frequency shift of porous silicon electroluminescent devices when Ag films are used as solid electrical contacts in replacement of electrolytic ones.
format Articulo
Articulo
author Toranzos, Victor J.
Ortiz, Guillermo P.
Mochán, W. Luis
Zerbino, Jorge Omar
author_facet Toranzos, Victor J.
Ortiz, Guillermo P.
Mochán, W. Luis
Zerbino, Jorge Omar
author_sort Toranzos, Victor J.
title Optical and electrical properties of nanostructured metallic electrical contacts
title_short Optical and electrical properties of nanostructured metallic electrical contacts
title_full Optical and electrical properties of nanostructured metallic electrical contacts
title_fullStr Optical and electrical properties of nanostructured metallic electrical contacts
title_full_unstemmed Optical and electrical properties of nanostructured metallic electrical contacts
title_sort optical and electrical properties of nanostructured metallic electrical contacts
publishDate 2017
url http://sedici.unlp.edu.ar/handle/10915/87462
work_keys_str_mv AT toranzosvictorj opticalandelectricalpropertiesofnanostructuredmetallicelectricalcontacts
AT ortizguillermop opticalandelectricalpropertiesofnanostructuredmetallicelectricalcontacts
AT mochanwluis opticalandelectricalpropertiesofnanostructuredmetallicelectricalcontacts
AT zerbinojorgeomar opticalandelectricalpropertiesofnanostructuredmetallicelectricalcontacts
bdutipo_str Repositorios
_version_ 1764820490085466114

Ejemplares similares