Validity of the linear growth equation for interface evolution for copper electrodeposition in the presence of organic additives

The interface evolution of copper electrodeposits produced on copper from a thiorea-derivative-containing acid plating bath at a low current density and 298 K was studied by atomic force microscopy (AFM). The dynamic scaling theory was applied to AFM images leading to scaling exponents, which are co...

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Detalles Bibliográficos
Autores principales: Vázquez, L., Salvarezza, Roberto Carlos, Arvia, Alejandro Jorge
Formato: Articulo
Lenguaje:Inglés
Publicado: 1997
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Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/86332
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